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  2. Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series (Tohoku Electronic Industry Co., Ltd.)
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-CLA-FS5
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Cla-ID5
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Cla-img4
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Cla-img5
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-CLA-SP3
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Tohoku Electronic Industry Co., Ltd.

Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series
Tohoku Electronic Industry Co., Ltd.

Tohoku Electronic Industry Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

49.1hours

About This Product

Kemirmilm Nessence Analyzer is a weak light emission detection device in the world, which measures very weak light that is invisible to human eyes. It is used in various fields, including the early oxidation measurement of organic matter in the early stages of oxidation.

■ Benefits of Kemirmi Nessence Law

・ Capture the change of material (oxidation deterioration, chemical reaction) in the very early stage ・ Detection of active oxygen and trace substances ・ Detection of physical light emission by cavitation and friction ・ High -speed analysis (femtomol, PPB level) is possible in combination with HPLC (high -speed liquid chromatography) and laser light source, etc.

■ In the early early oxide detection detection

When measuring oxidation deterioration, it is possible to detect even the oxidation deterioration in the early stages compared to other measurement methods. Since heating measurements are directly degraded, the peroxide is deteriorated, and the emerging light emission is detected, so that the change can be captured even if the promotion test time is short.

■ Shortening of development period

In the case of the kemirumi method, early oxidation measurement is possible, so it can be evaluated earlier and reduced the development period.

■ Optimization of manufacturing processes

Plastic products deteriorate thermal history in the process of manufactured and molded processing. At the time of shipment inspection, the appearance and color are checked, but even if there is no change, there are cases where oxidation is actually deteriorated, and in some cases it is a defective product. In addition, unused items such as spools and runners during molding are often pellets and recycled, but if they are mixed with many recycled products, oxidation deteriorates. By using CL, it is possible to know these management and optimal manufacturing conditions.

■ Equipment configuration

The following device can be selected and combined according to the purpose of use. ・ CLA-FS5 ・ CLA-ID5 ・ CLA-img4 ・ CLA-SP3

  • Product

    Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series

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5 Models of Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series

Click on the part number for more information about each product

Image Part Number Price (excluding tax) Detection method Detected wavelength cooling method Measurement item Minimum measurement time (Gate Time) Spectroscopy filter Touch panel display item Communication function size weight Effective pixels resolution Exposure time lens Visceral shutter
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Part Number-CLA-FS5

CLA-FS5

Available upon quote

Single Photon counting method (Single Hikari Mathematics Law)
Use optical electronic multiplent tube (photomal)

300nm ~ 650nm (central wavelength 420nm)

Primary cooling: Peltier element
Secondary cooling: Water cooling

① Light emission (COUNTS/SEC.)
② Light emission spectrum (380nm ~ 660nm/20m resolution)

0.1 seconds, 1 second, 10 seconds

5 built -in
(380nm ~ 660nm: every 20nm)

(1) Light emission amount ② sample room temperature ③ sample room setting temperature ④ Status ⑤GateTime ⑥ALARM
⑦ Detail ⑧ Opening and closing of the sample room ⑨ Shutter opening and closing state

B Port (1) Dedicated program use

523.5 (W) x411.5 (d) x547 (H) m

Approximately 60kg

- - - - -
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Part Number-Cla-ID5

Cla-ID5

Available upon quote

Single Photon counting method (Single Hikari Mathematics Law)
Use optical electronic multiplent tube (photomal)

300nm ~ 650nm (central wavelength 420nm)

Primary cooling: Peltier element
Secondary cooling: Water cooling

Light emission (COUNTS/SEC.)

0.1 seconds, 1 second, 10 seconds

-

(1) Light emission amount ② sample room temperature ③ sample room setting temperature ④ Status ⑤GateTime ⑥ALARM
⑦ Detail ⑧ Opening and closing of the sample room ⑨ Shutter opening and closing state

B Port (1) Dedicated program use

310 (W) x420 (D) x524 (H) mm

Approximately 35kg

- - - - -
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Part Number-Cla-img4

Cla-img4

Available upon quote - - - - - - - - - - - - - - -
Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Part Number-Cla-img5

Cla-img5

Available upon quote

Back irradiation frame transfa CCD camera

400 ~ 800Nm (central wavelength 600Nm)

Air cooling

Light emission image
Light emission brightness (within the image selection)

- - -

IEEE1394B

310 (W) x 446 (D) x 775 (H) mm

Approximately 30kg

1,024 x 1,024 pixels

Space degradation ability: 150 μm x 150 μm
(Options: about 10μm)

30ms ~ 120min

25mmF0.95 (C mount)

Built -in mechanical shutter

Mummy weak light emission detection division of lighting system Kemirmilmi Nessense Analyzer Series-Part Number-CLA-SP3

CLA-SP3

Available upon quote

Back irradiation frame transfa CCD camera

400 ~ 800Nm (central wavelength 600Nm)

Air cooling

Light emission spectrum measurement

- - -

USB

310 (W) x420 (D) x524 (H) mm

Approximately 35kg

1,600 x 200 pixels

Wavelength decomposition ability: 1nm

0.01 ~ 10,000sec

Incident slit width: 0.1/0.5/1.0mm

-

Click on the part number for more information about each product

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Response time: 49.12 hours

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About Company Handling This Product

Tohoku Electronic Industry Co., Ltd.

Response Rate

100.0%

Response Time

49.1hrs

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