Foreign matter detection system Contamination Inspection System (Mitani Shoji)
Foreign matter detection system Contamination Inspection System
Mitani Shoji
This product is registered by Mitani Shoji.
About This Product
Foreign matter detection system Contamination Inspection System
Aiming for high quality "manufacturing"
We will build an exterior inspection system using image processing.
For example, this is a dedicated system that allows you to review the pass / fail judgment and test results by visual inspection and automatic inspection, for the purpose of measuring foreign substances on the membrane filter, granularity distribution measurement, and analysis of the width and height of the etching pattern on siliconweha.
<Please contact us for such a person>
◆ Focusing on test accuracy by foreign substances, defects on the surface of the wafer, and pattern tests
◆ We are considering automation inspection systems by reducing errors due to artificial factors.
◆ There are cases in which the observation points are lost during visual inspection and the test is redone.
◆ For a long time, a fixed posture, such as looking into a microscope, is forced, and the work burden is large.
◆ I want to make effective use of existing equipment
◆ Looking for a cheap inspection system within 10 million yen
* Not applied in the case of laser microscope specifications
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