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  4. Multipoint Langmuir probe measurement system (Arios Co., Ltd.)
Multipoint Langmuir probe measurement system-Multipoint Langmuir probe measurement system
Multipoint Langmuir probe measurement system-Arios Co., Ltd.

Multipoint Langmuir probe measurement system
Arios Co., Ltd.

About This Product

■Summary

This is a system that measures plasma parameters at multiple points using the Langmuir probe method. Convenient for measuring the distribution of various plasma parameters on a target or sample. The LMP-100SCAN multi-point processing software enables efficient measurement. Q&As regarding plasma measurement and diagnosis are posted in the consultation room: Langmuir Probe. Please also take a look.

■Features

・The multi-point Langmuir probe enables plasma parameter measurements at multiple points, making it easy to measure their distribution. ・You can freely select the number of measurement points from 1 to 100. - Two types of multi-point switching units are available depending on the number of measurement points selected.

■System configuration

・Multi-point Langmuir probe ・Multi-point Langmuir probe processing software LMP-100SCAN ・Source measure unit (4-quadrant power supply - shortest source measure cycle is 1ms) ・GS610 Voltage and current range ±110V, ±500mA (manufactured by Yokogawa Electric Corporation TM) ・GPIB controller ・GPIB-USB-HS (manufactured by Japan National Instruments TM) ・Multi-point switching unit ・JIS standard rack mount type (H49mm x W480mm x D300mm) (corresponding number of points 1 to 100) ・Direct mounting BOX type (H58mm x W200mm x D300mm) (corresponding number of points 1 to 16 points) ・Personal computer (PC)

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    Multipoint Langmuir probe measurement system

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1 Models of Multipoint Langmuir probe measurement system

Image Part Number Price (excluding tax)
Multipoint Langmuir probe measurement system-Part Number-Multipoint Langmuir probe measurement system

Multipoint Langmuir probe measurement system

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About Company Handling This Product

Arios Co., Ltd.

  • Japan

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