Photo-induced force microscopy (IR-PiFM)
Oki Riko Jizai Co., Ltd.
About This Product
■Summary
The world's highest spatial resolution AFM-IR device [spatial resolution <10nm]. A measurement method that combines AFM (atomic force microscope) and IR laser. Sensitive detection of the force induced between the tip and sample by wavelength-dependent IR absorption using an amplified AFM cantilever. Chemical imaging in the nano domain is possible.
■Features of AFM-IR PiFM nanoscale infrared spectroscopic imaging device [photoinduced force microscope]
・World's highest spatial resolution 10nm chemical imaging (regardless of sample type)
・Obtain information only from the outermost surface (signals from deeper parts are not detected)
・No need to section the sample, even block-shaped samples do not affect spatial resolution
・Equipped with high-speed hyPIR™ imaging function that acquires spectra at every pixel
・No background noise because dipole force is detected
■Measurement principle of AFM-IR / PiFM photo-induced force microscope
PiFM is a measurement method that combines AFM and laser light. When a sample and AFM tip are irradiated with laser light of a specific wavelength, there are certain materials that specifically react (induced) to that wavelength of light. By bringing the induced material and the induced AFM tip into close proximity, material interactions are detected.
The force region between the polymer sample and the AFM tip is extremely narrow (<10 nm), allowing high-resolution chemical images (spatial resolution <10 nm) and high-resolution spectra (resolution <1 cm-1) to be obtained. By detecting this induced force with AFM, it is possible to observe not only AFM images but also chemical imaging at the nano-level with high accuracy and resolution.
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Product
Photo-induced force microscopy (IR-PiFM)
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Handling Company
Oki Riko Jizai Co., Ltd.
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Categories
1 Models of Photo-induced force microscopy (IR-PiFM)
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IR-PiFM |
Available upon quote |
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About Company Handling This Product
- Japan