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  2. Temperature test device for DIP inspection PTT-300 (Yamaha Robotics Holdings Co., Ltd.)
Temperature test device for DIP inspection PTT-300-PTT-300
Temperature test device for DIP inspection PTT-300-Yamaha Robotics Holdings Co., Ltd.

Temperature test device for DIP inspection PTT-300
Yamaha Robotics Holdings Co., Ltd.

Yamaha Robotics Holdings Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

39.3hours

About This Product

■Summary

This is a device that inspects the temperature characteristics of SMD type crystal oscillators. DIP (dip) testing of temperature characteristics is possible by continuously changing the temperature in the range from -30℃ to +85℃.

■Features

-This device uses a Peltier element for temperature control, and by placing an SMD crystal oscillator on a plate whose temperature is controlled by the Peltier element, highly accurate temperature characteristic tests are possible. In addition, by controlling the temperature in the range of -30 to +85°C in 0.5°C temperature steps, DIP inspection of accurate temperature characteristics is possible. ・Achieves high throughput by measuring multiple units simultaneously. ・The loader and unloader perform everything automatically, from supply to sorting to storage. ・This temperature inspection device is ideal for development, quality assurance, prototyping, and small-lot production.

■Usage example

・This is a device that inspects the temperature characteristics of SMD type crystal oscillators. ・DIP (dip) inspection of temperature characteristics is possible by continuously changing the temperature in the range from -30℃ to +85℃.

■Optional support

・Temperature characteristics inspection of SMD type crystal resonator ・Supports multiple types by replacing dedicated jigs

■Temperature time (approximate)

・+25℃⇒-30℃: Approximately 5 minutes ・-30℃⇒+85℃: Approximately 10 minutes ・+85℃⇒+25℃: Approximately 5 minutes

  • Product

    Temperature test device for DIP inspection PTT-300

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1 Models of Temperature test device for DIP inspection PTT-300

Image Part Number Price (excluding tax) Stylus block Measuring instrument Temperature control method Temperature control plate Temperature range Target work size Target work External dimensions Work supply Option
Temperature test device for DIP inspection PTT-300-Part Number-PTT-300

PTT-300

Available upon quote

Probe type: 2 sets (temperature control plate 1, temperature control plate 2, 1 set each)

Frequency counter + power supply

Peltier element + chiller unit

Dedicated tray with approximately 80 pieces

-30℃~+85℃ *Temperature range is negotiable

5.0×3.2~1.6×1.2 (mm) Work size is negotiable

・SMD type crystal oscillator
・SMD type crystal resonator can be supported as an option.

・Main body W1,200×D800×H1,500mm (excluding protrusions such as measuring instruments and patrol lights)
・Chiller W340×D384×H851mm×4 types (for temperature control plate)

Supplied from stacked trays and transferred to temperature control plate (special tray)

・Compatible with SMD type crystal resonators
・Can handle multiple sizes of products with switching parts

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About Company Handling This Product

Yamaha Robotics Holdings Co., Ltd.

Response Rate

100.0%

Response Time

39.3hrs

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