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  2. Environmental control photoelectron microscope FE-LEEM/PEEM P90 NAP capable of measuring at a vacuum level of 1 mbar (Tokyo Instruments, Inc)
Environmental control photoelectron microscope FE-LEEM/PEEM P90 NAP capable of measuring at a vacuum level of 1 mbar-FE-LEEM/PEEM P90 NAP
Environmental control photoelectron microscope FE-LEEM/PEEM P90 NAP capable of measuring at a vacuum level of 1 mbar-Tokyo Instruments, Inc

Environmental control photoelectron microscope FE-LEEM/PEEM P90 NAP capable of measuring at a vacuum level of 1 mbar
Tokyo Instruments, Inc

About This Product

■Summary

FE-LEEM/PEEM P90 NAP is a unique product that applies the measurement technology under sub-atmospheric pressure that SPECS has cultivated with NAP-XPS to PEEM/LEEM. This allows PEEM/LEEM measurement in a 1mbar environment.

■Features

・Can measure from UHV up to 1 mbar ・Maximum sample temperature 1,000℃ ・Spatial resolution < 30 nm (0.1 mbar) ・Built-in energy filter

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    Environmental control photoelectron microscope FE-LEEM/PEEM P90 NAP capable of measuring at a vacuum level of 1 mbar

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1 Models of Environmental control photoelectron microscope FE-LEEM/PEEM P90 NAP capable of measuring at a vacuum level of 1 mbar

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Environmental control photoelectron microscope FE-LEEM/PEEM P90 NAP capable of measuring at a vacuum level of 1 mbar-Part Number-FE-LEEM/PEEM P90 NAP

FE-LEEM/PEEM P90 NAP

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About Company Handling This Product

Tokyo Instruments, Inc

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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