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  4. Measure work function and surface potential of clean surfaces under ultra-high vacuum Ultra-high vacuum Kelvin probe (UHV series) (Tokyo Instruments, Inc)
Measure work function and surface potential of clean surfaces under ultra-high vacuum Ultra-high vacuum Kelvin probe (UHV series)-UHVKP020
Measure work function and surface potential of clean surfaces under ultra-high vacuum Ultra-high vacuum Kelvin probe (UHV series)-Tokyo Instruments, Inc

Measure work function and surface potential of clean surfaces under ultra-high vacuum Ultra-high vacuum Kelvin probe (UHV series)
Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

Response Rate

100.0%

Response Time

24.1hours

Relatively Fast Response

About This Product

■Summary

Kelvin probe (KP) compatible with ultra-high vacuum (UHV) environments. Work function and surface potential can be measured by connecting to an existing vacuum chamber. A dedicated UHV Kelvin probe chamber (cell) is also available. In addition to the UHV environment, it is also possible to introduce atmospheric air and various gases. The compact design allows exhaust and gas introduction in a short time. Highly reliable data can be obtained under ideal conditions.

■Features

・High precision and high resolution measurement under UHV environment < 3meV (UHV030) ・High SN measurement using Off-Null (Baikie) method ・Measurement in UHV, gas, and atmosphere ・Able to build automated system ・Various custom orders available: chip size/shape, flange size, sample heater

■What is the Off-Null (Baikie) method?

In the traditional KP method, the bias voltage that makes the probe signal zero is determined, and the work function is determined from this voltage. On the other hand, with the Off-Null (Baikie) method, there is no need to measure minute voltages near OV, and there is no need for an expensive lock-in amplifier. Therefore, it is less susceptible to the effects of the measurement environment and noise, and can measure work functions more quickly and accurately with a high signal-to-noise ratio.

■Main uses

・Evaluation of solar cell materials ・Research on photocatalysts, etc.

  • Product

    Measure work function and surface potential of clean surfaces under ultra-high vacuum Ultra-high vacuum Kelvin probe (UHV series)

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1 Models of Measure work function and surface potential of clean surfaces under ultra-high vacuum Ultra-high vacuum Kelvin probe (UHV series)

Image Part Number Price (excluding tax) Movement stage (Z axis) Work function resolution Chip material/diameter UHV chamber (cell)
Measure work function and surface potential of clean surfaces under ultra-high vacuum Ultra-high vacuum Kelvin probe (UHV series)-Part Number-UHVKP020

UHVKP020

Available upon quote

50 mm, manual (option: automatic)

< 3 meV

Stainless steel / 4 mm

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About Company Handling This Product

Tokyo Instruments, Inc

Response Rate

100.0%

Response Time

24.1hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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Kelvin Probes　Tokyo Instruments, Inc
Tokyo Instruments, Inc

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