All Categories

History

Measures work function and surface potential with high sensitivity and precision. Wide range mapping is also possible. Scanning Kelvin probe system (SKP series)-KP020
Measures work function and surface potential with high sensitivity and precision. Wide range mapping is also possible. Scanning Kelvin probe system (SKP series)-Tokyo Instruments, Inc

Measures work function and surface potential with high sensitivity and precision. Wide range mapping is also possible. Scanning Kelvin probe system (SKP series)
Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

Response Rate

100.0%

Response Time

36.5hours


About This Product

■Summary

This is a work function/surface potential mapping device developed by KP Techonology, a long-established manufacturer of Kelvin probes in the UK. In the atmosphere, non-destructively, and non-contact, we evaluate the uniformity of transparent electrodes and organic thin film properties, changes in composition, property distribution of battery electrode materials and semiconductor materials, and even the corrosion state of metal surfaces, including work functions and surface potentials. As a variation, we perform two-dimensional mapping of a large area. It is possible to measure not only metals and semiconductor materials, but also dielectric materials such as oxides. The SKP series includes a Kelvin probe, scanning stage, and electrostatic shield cover for noise isolation. The maximum scanning area of ​​the stage is 300 x 300 mm, and the unique Off-Null (Baikie) method achieves high S/N stability and high resolution of 1 to 3 meV.

■Features

・Work function and surface potential measurement using Kelvin probe method ・Stable high S/N ratio measurement using Off-Null (Baikie) method ・High resolution measurement 1 to 3 meV ・Non-destructive, non-contact measurement ・Easy measurement in the atmosphere ・Stage scanning range: max. 300 x 300 mm ・Ultra-high vacuum compatible model available

■What is the Off-Null (Baikie) method?

The traditional method for Kelvin probes is to find a bias voltage that makes the signal from the probe zero, and then find the work function from this voltage. On the other hand, in the Off-Null (Baikie) method, a voltage that balances the bias voltage and signal voltage is obtained by scanning the bias voltage, so there is no need to measure small voltage signals. Therefore, work functions can be measured more quickly and accurately with a high signal-to-noise ratio without being affected by the measurement environment or noise.

■Main uses

・Evaluation of organic EL materials ・Thin film quality evaluation ・Solar cells/organic thin film solar cells ・Organic/inorganic semiconductors ·metal ・Erosion/Corrosion

■Options

・Light source for surface photovoltage measurement (quartz tungsten halogen light source/LED) ・Wavelength tunable light source for surface photovoltage measurement (400 to 1,000 nm)

  • Product

    Measures work function and surface potential with high sensitivity and precision. Wide range mapping is also possible. Scanning Kelvin probe system (SKP series)

Share this product


40+ people viewing

Last viewed: 9 hours ago


Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of Measures work function and surface potential with high sensitivity and precision. Wide range mapping is also possible. Scanning Kelvin probe system (SKP series)

Image Part Number Price (excluding tax) Scanning pattern Maximum scanning area (mm) Work function resolution Chip material/diameter Accessories
Measures work function and surface potential with high sensitivity and precision. Wide range mapping is also possible. Scanning Kelvin probe system (SKP series)-Part Number-KP020

KP020

Available upon quote

Point measurement

< 3 meV

Gold / 2mm

Observation camera, small monitor, oscilloscope, electrostatic shield cover

Customers who viewed this product also viewed

Reviews shown here are reviews of companies.

See More Kelvin Probes Products

Other products of Tokyo Instruments, Inc

Reviews shown here are reviews of companies.


View more products of Tokyo Instruments, Inc

About Company Handling This Product

Response Rate

100.0%


Response Time

36.5hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

See More

  • Japan

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2024 Metoree