Introducing an innovative tool for operando analysis of electronic device materials Achieves energy level measurement under actual operation Operando KP-PYS material analysis system-Operand KP-PYS Material Analysis System
Introducing an innovative tool for operando analysis of electronic device materials Achieves energy level measurement under actual operation Operando KP-PYS material analysis system-Tokyo Instruments, Inc

Introducing an innovative tool for operando analysis of electronic device materials Achieves energy level measurement under actual operation Operando KP-PYS material analysis system
Tokyo Instruments, Inc


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■Summary This device, the "Operando KP*-PYS** Material Analysis System," is the world's first product that "realizes energy level measurement under actual operation" by combining a Kelvin probe and photoelectron yield spectroscopy. *KP: Kelvin probe **PYS: Photoelectron yield spectroscopy This is a collaboration product between KP Technology and group company Unisoku. ■Features/Applications ・Measurement of Fermi level, ionization potential, and band gap in UHV environment ・Measurement in actual operating environment, such as while heating/cooling the sample or applying bias voltage ・High-precision LUMO level measurement is also possible by connecting low-energy IPES (LEIPS*) *Manufactured by ALS Technology Co., Ltd. ・Measurement of organic/inorganic semiconductor devices ・Transportation between the KP/PYS measurement room and sample processing room without exposing it to the atmosphere

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    Introducing an innovative tool for operando analysis of electronic device materials Achieves energy level measurement under actual operation Operando KP-PYS material analysis system

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Operand KP-PYS Material Analysis System

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