Optimal for spherical lenses Oblique incidence birefringence phase difference measurement device Exicor OIA-Exicor OIA

Optimal for spherical lenses Oblique incidence birefringence phase difference measurement device Exicor OIA
Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

Response Rate

100.0%

Response Time

36.5hours

About This Product

■SummaryHINDS's grazing-incidence birefringence phase difference measurement device Exicor®OIA is a new birefringence measurement device with a ray-tracing function that can measure not only oblique-incidence measurements of parallel plate samples but also birefringence of spherical lenses. is now possible.

Until now, it was only possible to measure the strain distribution of a parallel plate before it was processed into a lens shape, but Exicor OIA can measure the spherical lens actually used at any angle of incidence.

Additionally, a measuring device is installed on the side to measure the birefringence distribution in the cross-sectional direction. The measurement wavelength is not only 193nm and 633nm, but can also be customized to your desired wavelength.

■Birefringence measurement of parallel plate and spherical lensTypical birefringence measurement equipment performs transmission measurement using normal incidence, but oblique incidence measurement is essential for measuring the refractive index ellipsoid of a sample. With a sample whose thickness is negligible, such as a retardation film, the optical axis hardly changes even if the sample is tilted and measured, but with a glass substrate, the optical axis changes in proportion to the thickness, making measurement difficult. I couldn't. Exicor OIA allows for oblique-incidence birefringence measurement of thick samples because the measurement module on the incident side and detection side moves in consideration of the incident angle and sample thickness.

Additionally, Exicor OIA can measure birefringence of spherical lenses. For example, birefringence can be measured while keeping the ray angle constant within a spherical lens. This is very different from traditional birefringence measurements on lens samples. This is because in conventional methods, to eliminate refraction caused by the lens, measurements are made by soaking the lens in refractive index matching oil or by placing the lens in a surface-emitting illumination section. Therefore, it is not possible to measure birefringence for each ray angle within the sample.

Exicor OIA can perform measurements by setting any ray angle within the sample, making it possible to evaluate three-dimensional refractive index distribution and birefringence considering the ray angle actually used.

■Birefringence measurement in cross-sectional directionIt supports not only oblique incidence measurement but also measurement from the cross-sectional direction. The specimen can be not only cubic but also cylindrical.

■Device selection according to the applicationThe measuring device supports high-precision birefringence measurement equivalent to the standard Exicor series. In addition, the stage size can be customized according to the sample size.

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Optimal for spherical lenses Oblique incidence birefringence phase difference measurement device Exicor OIA

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Tokyo Instruments, Inc

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Observation Equipment

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1 Models of Optimal for spherical lenses Oblique incidence birefringence phase difference measurement device Exicor OIA

Image	Part Number	Price (excluding tax)	Leading axis repeatability	Fast axis resolution	Measurement wavelength	Wavelength	Light source	Phase difference repeatability	Phase difference measurement range	Phase difference resolution
	Exicor OIA	Available upon quote	±0.5 degree	0.01 degree	VIS/DUV	VIS: 632.8nm DUV: 193nm etc.	VIS : HeNe laser ( ( ( ( DUV: LDLS light source / deuterium light source	VIS: ±0.03nm DUV: ±0.08nm	VIS: 0~300nm or more DUV: 0~90nm or more	0.001nm

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About Company Handling This Product

Tokyo Instruments, Inc

Response Rate

100.0%

Response Time

36.5hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

Japan

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Optimal for spherical lenses Oblique incidence birefringence phase difference measurement device Exicor OIA Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

About This Product

■Summary

■Birefringence measurement of parallel plate and spherical lens

■Birefringence measurement in cross-sectional direction

■Device selection according to the application

1 Models of Optimal for spherical lenses Oblique incidence birefringence phase difference measurement device Exicor OIA

Exicor OIA

Customers who viewed this product also viewed

Other products of Tokyo Instruments, Inc

About Company Handling This Product

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Optimal for spherical lenses Oblique incidence birefringence phase difference measurement device Exicor OIA
Tokyo Instruments, Inc