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  4. Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si (Tokyo Instruments, Inc)
Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si-Exicor PV-Si
Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si-Tokyo Instruments, Inc

Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si
Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

Response Rate

100.0%

Response Time

30.7hours

Relatively Fast Response

About This Product

■Summary

The birefringence phase difference measurement device Exicor® PV-Si measures the birefringence distribution of silicon, sapphire, silicon carbide, zinc selenide, cadmium sulfide, etc. using infrared light at a wavelength of 1,550 nm. Model "500-Si-Ingot" corresponds to ingots (8 inches, 500 mm length) before being cut into silicon wafers.

■Features

・Distortion testing of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide ・Measurement as grown ingots (Squared, As grown ingots)

  • Product

    Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si

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1 Models of Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si

Image Part Number Price (excluding tax) Measurement wavelength Measurement time Measurement spot size Retardation repeat measurement accuracy Ingot size
Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si-Part Number-Exicor PV-Si

Exicor PV-Si

Available upon quote

1,550nm

Maximum 100 points/sec

2mm diameter

0.1nm

500×150mm (Squared ingot)
500×210mm (As-grown ingot)

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About Company Handling This Product

Tokyo Instruments, Inc

Response Rate

100.0%

Response Time

30.7hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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