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  2. Highly sensitive detection of all polarization characteristic distributions Mueller matrix polarimeter Exicor XT (Tokyo Instruments, Inc)
Highly sensitive detection of all polarization characteristic distributions Mueller matrix polarimeter Exicor XT-Exicor XT
Highly sensitive detection of all polarization characteristic distributions Mueller matrix polarimeter Exicor XT-Tokyo Instruments, Inc

Highly sensitive detection of all polarization characteristic distributions Mueller matrix polarimeter Exicor XT
Tokyo Instruments, Inc

About This Product

■Summary

HINDS' Mueller matrix polarimeter Exicor® XT series measures all polarization properties of materials (linear birefringence, circular birefringence, linear dichroism, circular dichroism, depolarization) with high sensitivity and in a short time. This is the latest polarization measuring device. This device is an advanced version of the well-established phase modulation method used in the Exicor AT series of ultra-low-level birefringence phase difference measuring devices, and measures all 16 elements of the Mueller matrix using a total of four PEMs. For example, it is possible to measure slight circular birefringence (optical rotation) and depolarization components contained in retardation films. Model 150XT is equipped with a HeNe laser (633 nm) as a light source and a 150 mm XY stage, and can perform Mueller matrix mapping with simple operations. The software analyzes and displays each polarization characteristic from the measured Mueller matrix, so even those who are not familiar with Mueller matrices can use it, and it can be used as a highly versatile measuring instrument that can measure things other than birefringence.

■Features

・Measure all 16 elements of the Mueller matrix ・Overwhelmingly high sensitivity and high precision measurement ・Simultaneous and high-speed measurement of all polarization characteristics ・Stable measurement without rotational movement using Four PEM technology ・User-friendly and easy-to-use software ・Customizable measurement wavelength (UV to IR), sample stage, etc.

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    Highly sensitive detection of all polarization characteristic distributions Mueller matrix polarimeter Exicor XT

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1 Models of Highly sensitive detection of all polarization characteristic distributions Mueller matrix polarimeter Exicor XT

Image Part Number Price (excluding tax) Birefringence fast axis repeatability Birefringence fast axis measurement range Birefringence phase difference repeatability Birefringence phase difference measurement range Linear dichroism transmission axis repeatability Linear dichroism transmission axis measurement range Line dichroism Repeatability Line dichroism measurement range Measurement wavelength Measurement principle Polarization modulation Measurement principle Signal analysis Optical rotation Repeatability Optical rotation measurement range Circular dichroism Repeatability Circular dichroism measurement range Spot diameter Stage size
Highly sensitive detection of all polarization characteristic distributions Mueller matrix polarimeter Exicor XT-Part Number-Exicor XT

Exicor XT

Available upon quote

0.05 degrees @>5nm

±90 degrees

0.03nm or 1%

0 - λ/2

0.1 degrees

±90 degrees

0.001 or 1%

±1

632.8nm
Compatible with 180~2,500nm range

Four PEM phase modulation method

Fourier transform method

0.05 degree

±90 degrees

0.001

±1

~1mm

150mm×150mm
500mm×500mm etc.

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About Company Handling This Product

Tokyo Instruments, Inc

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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