Simultaneous measurement of spectroscopic spectrum and polarization Spectroscopic polarimeter Poxi-spectra PX-VIS01-PX-VIS01

Simultaneous measurement of spectroscopic spectrum and polarization Spectroscopic polarimeter Poxi-spectra PX-VIS01
Tokyo Instruments, Inc

About This Product

■Highly functional spectroscopic polarization measurement -Poxi-spectra-Poxi-spectra™ is a polarization measuring device that measures the polarization state of each wavelength in the visible wavelength range of 400 to 800 nm (extended to 900 nm), and is also called a spectroscopic polarimeter or spectroscopic ellipsometer. This device measures parameters representing polarization such as polarization axis orientation, ellipticity, and degree of polarization (DOP) by measuring a parameter representing the state of polarization called the Stokes vector.

Since its launch, it has been widely used for polarization analysis of LCD televisions, LCD projectors, polarization optical elements, polarization optical systems, crystals, biological samples, etc. We also have a track record of custom-made equipment for ultraviolet to infrared ranges and microscopic measurements. It also supports sample birefringence, Mueller matrix measurements, and mapping measurements.

■Spectral polarization measurementIn addition to measuring the polarization of light transmitted through optical elements and reflected light, we also measure various types of polarization, including light sources such as lamps, overall optical characteristics, and fluorescence polarization. Just by installing the optical head, you can start measuring immediately without complicated equipment calibration.

■Options and customizationWhen measuring optical elements etc. with a Stokes polarimeter, you will need a light source, measurement bench, etc. according to the purpose. For example, we propose a transmission bench using a halogen lamp light source and an attenuator to adjust the light intensity.

In addition, when measuring weak fluorescence with high precision, it is compatible with ANDOR's spectroscopic detector, which has a reputation for weak light spectroscopy. When measuring polarized light in a minute spot, this device can be mounted on a microscope.

The standard measurement wavelength range is 400 to 800 nm, but it is also possible to create devices with wavelengths shifted to the ultraviolet or near-infrared region.

■ (Higher order) birefringence and Mueller matrix measurements also possibleIn addition to light polarization analysis, Poxi-spectra™ provides options for spectroscopic birefringence measurement and spectroscopic Mueller matrix measurement. Mueller matrix measurement has previously been included in expensive ellipsometers and polarimeters, but this device can also measure it automatically and easily.

Birefringence phase difference measurement supports retardation from near 0 nm to half wavelength, and the fast axis direction can also be determined at the same time. Furthermore, it has the ability to analyze high-order retardation by taking advantage of its multi-wavelength measurement, and is compatible with super-birefringent samples of tens of thousands of nm or more.

Model
There is 1 model available for this product.

Product
Simultaneous measurement of spectroscopic spectrum and polarization Spectroscopic polarimeter Poxi-spectra PX-VIS01

Handling Company
Tokyo Instruments, Inc

20+ people viewing

Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of Simultaneous measurement of spectroscopic spectrum and polarization Spectroscopic polarimeter Poxi-spectra PX-VIS01

Image	Part Number	Price (excluding tax)	Device configuration	Repeatability	Measurement items	Measurement error	Measurement wavelength range	Measurement time	Wavelength resolution	Example of options
	PX-VIS01	Available upon quote	Optical head, controller, PC, Poxi software	<0.005 (3σ, S1~S3)	Stokes parameter, ellipticity, orientation, degree of polarization	2% or less	400nm~800nm (UV~NIR possible)	6 seconds to 1 minute (depending on exposure time, number of integrations, and measurement mode)	2nm	Optical Muller matrix measurement Birefringence measurement ANDOR high sensitivity spectroscopic detector

Other products of Tokyo Instruments, Inc

Reviews shown here are reviews of companies.

MPA100 melting point measuring device OptiMelt

Tokyo Instruments, Inc

170+ people viewing

Response time: 23.21 hours

Melting Point Determination Apparatuses

Next-generation green laser LD-pumped high-power solid-state laser

Tokyo Instruments, Inc

160+ people viewing

Response time: 23.21 hours

Laser Light Sources

3 models listed

Excellent beam quality, high stability, modular type compact semiconductor laser Lambda Beam

Tokyo Instruments, Inc

280+ people viewing

Last viewed: 12 hours ago

Response time: 23.21 hours

Laser Diodes

3 models listed

Lambda mini, a small diode laser equipped with a controller and USB power supply

Tokyo Instruments, Inc

200+ people viewing

Response time: 23.21 hours

Laser Diodes

2 models listed

Ideal replacement for He-Cd lasers 320nm, up to 200mW, narrow linewidth, excellent frequency stability CW single frequency DPSS laser

Tokyo Instruments, Inc

230+ people viewing

Last viewed: 3 hours ago

Response time: 23.21 hours

Laser Light Sources

3 models listed

Ideal for atomic clocks, oscillating at the transition frequency of strontium and rubidium Ultra-narrow linewidth CW (continuous wave) laser for quantum technology Solo QT

Tokyo Instruments, Inc

130+ people viewing

Response time: 23.21 hours

Laser Light Sources

Blue high power semiconductor laser PLS series

Tokyo Instruments, Inc

200+ people viewing

Last viewed: 1 hour ago

Response time: 23.21 hours

Laser Diodes

3 models listed

Compact Flash Lamp Pumped Q-Switch Nanosecond Nd:YAG Laser NL300 Series

Tokyo Instruments, Inc

210+ people viewing

Last viewed: 8 hours ago

Response time: 23.21 hours

Laser Light Sources

3 models listed

High energy broadband tunable nanosecond laser NT230 series

Tokyo Instruments, Inc

180+ people viewing

Last viewed: 2 hours ago

Response time: 23.21 hours

Laser Light Sources

3 models listed

Tunable photoacoustic imaging light source PhotoSonus M

Tokyo Instruments, Inc

130+ people viewing

Response time: 23.21 hours

Laser Light Sources

2 models listed

Single Longitudinal Mode (SLM) High Energy Nanosecond Nd:YAG Laser ANL SLM Series

Tokyo Instruments, Inc

180+ people viewing

Last viewed: 5 hours ago

Response time: 23.21 hours

Laser Light Sources

2 models listed

Maximum output 200mW, maximum 250nJ, <130fs, suitable for THz-TDS Femtosecond fiber seeder LightWire FFS series

Tokyo Instruments, Inc

100+ people viewing

Last viewed: 22 hours ago

Response time: 23.21 hours

Laser Light Sources

2 models listed

View more products of Tokyo Instruments, Inc

About Company Handling This Product

Tokyo Instruments, Inc

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

Japan

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Simultaneous measurement of spectroscopic spectrum and polarization Spectroscopic polarimeter Poxi-spectra PX-VIS01 Tokyo Instruments, Inc

About This Product

■Highly functional spectroscopic polarization measurement -Poxi-spectra-

■Spectral polarization measurement

■Options and customization

■ (Higher order) birefringence and Mueller matrix measurements also possible

1 Models of Simultaneous measurement of spectroscopic spectrum and polarization Spectroscopic polarimeter Poxi-spectra PX-VIS01

PX-VIS01

Other products of Tokyo Instruments, Inc

About Company Handling This Product

Simultaneous measurement of spectroscopic spectrum and polarization Spectroscopic polarimeter Poxi-spectra PX-VIS01
Tokyo Instruments, Inc