Product
Spectroscopic measurement Nanosecond to millisecond transient absorption measurement system Laser flash photolysisHandling Company
Tokyo Instruments, IncCategories
Product Image | Part Number | Price (excluding tax) | Control/Analysis equipment Measurement function | Control/analysis equipment Control function | ICCD detector detection wavelength range | ICCD detector minimum gate width | Nd:YAG laser output energy | Nd:YAG laser output wavelength | Nd:YAG laser pulse width | Nd:YAG laser repetition frequency | Number of spectrometer gratings installed | Optical parametric oscillator (OPO) -1 | Optical parametric oscillator (OPO) -2 | Optical system Excitation energy output adjustment | Optical system sample | Optical system shutter (PC control) | Reference light source Light source | Reference light source Output wavelength | Spectrometer Number of output ports | Spectrometer Reverse Linear Dispersion | Spectrometer brightness | Spectrometer focal length | System performance Minimum measurement time ΔOD | System performance Minimum time resolution |
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Laser flash photolysis |
Available upon quote |
Transient absorption spectrum measurement Time-resolved fluorescence spectrum measurement |
ICCD detector, spectrometer, shutter | 180~850nm | <5 ns | 180/120/40/25mJ | 1,064/532/355/266nm | 4~5ns@532/355/266nm | 1~15 Hz variable | 4 |
Output wavelength 220~415 nm (signal light SHG) 415~710 nm (signal light) 710~2,300 nm (idler light) |
Line width: <5 cm-1 | Variable attenuator | Liquid and solid | For excitation light source and reference light | Pulsed or CW Xe lamp | 180~2,000 nm (pulsed Xe) | 2 | 2.37nm/mm | F/3.8 | 350mm | < 0.01 | 5ns |