Spectroscopic measurement High-sensitivity laser-induced plasma spectrometer with sub-ppm detection limit High-sensitivity double pulse LIBS
Tokyo Instruments, Inc
About This Product
■High-sensitivity double pulse LIBS overview
The LEA-S500 high-sensitivity double-pulse LIBS is a laser-induced plasma spectrometer developed for elemental analysis. Since it uses a double pulse laser, it has higher sensitivity than single pulse laser types. This allows elemental analysis of even small samples. In addition, there is no need for troublesome sample pretreatment, and measurements can be performed immediately.
■Uses highly sensitive double pulse method
Employs double pulse Q-switched Nd:YAG laser excitation with a wavelength of 1,064 nm and an output of 1 W. The double-pulse method increases plasma emission intensity and reduces background light, making it a more sensitive measurement method than the single-pulse method. In addition, the spectral lines become sharper, allowing for highly accurate measurements.
■Features
・High sensitivity detection limit sub ppm~
・High accuracy ~1% rmsd (nonlinearity, mean square deviation)
・Double pulse Nd:YAG laser used
・No pretreatment required, measurement in air
・Supported sample size: 12×12×2mm (minimum), 75×75×40mm (maximum)
・2D mapping ±5mm (maximum, optional)
・Analysis spot: φ30μm～1.7mm
■Applications
・Pig iron, copper, stainless steel, alloys, etc.
・Nonferrous metals
・Glass
・Ceramics, cement
・Agriculture (soil, fertilizer, agricultural products)
·plastic
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Product
Spectroscopic measurement High-sensitivity laser-induced plasma spectrometer with sub-ppm detection limit High-sensitivity double pulse LIBS
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Handling Company
Tokyo Instruments, Inc
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Categories
1 Models of Spectroscopic measurement High-sensitivity laser-induced plasma spectrometer with sub-ppm detection limit High-sensitivity double pulse LIBS
| Product Image | Part Number | Price (excluding tax) | Equipment dimensions | Excitation laser average pulse energy | Excitation laser laser | Measurement time | Sample Sample environment | Sample XY stage | Sample exhaust function | Sample measurement diameter | Sample sample adapter | Sample sample size | Software, analysis functions | Software, analysis functions Wavelength calibration | Software, analysis functions database | Spectroscopic detector dynamic range | Spectroscopic detector focal length | Spectroscopic detector grating | Spectroscopic detector sensor | Weight |
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LEA-S500 |
Available upon quote | 1,100×550×750mm | 100mJ | Q-switch Nd:YAG laser | 10 seconds to 3 minutes (depending on sample type) | In the air | ±5mm | Option | 0.03~1.7mm | For wire, thin sections, and small size samples |
12×12×2mm (minimum) 75×75×40mm (max.) |
Materials compatible with analysis programs ・Alloys such as aluminum, nickel, copper, titanium, etc. ・Steel or cast iron ・Conductive and non-conductive materials (plastics, ceramics, glass, etc.) Qualitative and quantitative analysis of different materials Automatic identification function of basic elements |
With automatic calibration function |
CRM/RM/SUS Other various materials |
14 bit | 500mm |
1,800 lines (190~800nm, 0.028nm) 2,400 lines (190~600nm, 0.020nm) 3,600 lines (190~400nm, 0.014nm) (Measurement wavelength range, resolution) |
2,048 pixel CCD | 120kg |
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About Company Handling This Product
- Japan