Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder HE-Nanofinder HE
Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder HE-Tokyo Instruments, Inc

Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder HE
Tokyo Instruments, Inc


About This Product

■3D microlaser Raman spectrometer Nanofinder HE High-end model of confocal Raman/TERS (Tip-Enhanced Raman Scattering) microscope ■EMCCD detector demo machine sales campaign for Raman spectroscopy equipment We are offering a demonstration model of the EMCCD detector used in our Nanofinder FLEX microlaser Raman spectrometer at a special price. We also offer various CCD detector and spectrometer sets and Raman spectroscopy module sets at low prices. ■Ideal for simultaneous Raman spectroscopy and AFM measurements 3D Microscopic Laser Raman Spectrometer Nanofinder HE is a microscopic Raman spectrometer ideal for simultaneous Raman spectroscopy and AFM measurements. With this single device, you can select various Raman measurements such as upright type, inverted type, and transmission type. In addition, up to four types of lasers can be installed, and the optics corresponding to each laser can be automatically controlled from a PC. In addition to confocal Raman spectroscopy measurements, by installing an AFM, it is also possible to perform AFM-Raman spectroscopy and near-field-Raman spectroscopy measurements. Features ■High stability High mechanical and thermal stability due to the use of granite material for the frame ■High precision Automatic wavelength calibration with built-in hollow cathode lamp ■High resolution Spatial and spectral resolution ■High sensitivity Optical system optimized for Raman ■Fast 3D Raman mapping possible <3 ms/point, AFM simultaneous measurement ■Easy operation Automatically correct confocal optical system (auto alignment) ■Applications ・Material science ・Nanotechnology ・Biological science ・Pharmaceutical ■What is TERS (Tip Enhanced Raman Spectroscopy)? This is a laser Raman microscope that combines a regular laser Raman microscope and an atomic force microscope (AFM) to generate surface-enhanced Raman light. By using a sharp probe, Raman scattering is locally enhanced. This dramatically increases spatial resolution compared to regular laser Raman microscopes.

  • Product

    Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder HE

Share this product


40+ people viewing

Last viewed: 16 hours ago


Free
Since our quotes are free, feel free to use our service.

No Phone Number Required
You won’t have to worry about receiving unnecessary calls.

1 Models of Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder HE

Product Image Part Number Price (excluding tax) 3D confocal micro-Raman spectroscopy Measurable Raman shift range 3D confocal micro-Raman spectroscopy Spatial resolution-2 3D confocal micro-Raman spectroscopy Spectral accuracy 3D confocal micro-Raman spectroscopy Wavenumber resolution 3D confocal micro-Raman spectroscopy mapping range 3D confocal micro-Raman spectroscopy mapping speed 3D confocal microscope Raman spectroscopy standard laser 3D confocal microscopic Raman spectroscopy Spatial resolution-1 3D confocal microscopic Raman spectroscopy Spatial resolution-3 Photodetector Cooled CCD (EMCCD) Detector-1 Photodetector Cooled CCD (EMCCD) Detector-2 Spectrometer Spectral performance-1 Spectrometer Spectral performance-2 Spectrometer Spectral performance-3 Spectrometer diffraction grating lineup Spectrometer entrance slit Spectrometer exit port Spectrometer focal length Spectrometer motor drive Spectrometer optical arrangement System configuration All-In-One device System configuration Granite frame System configuration Multi-configuration microscope System configuration Multi-configuration microscope objective lens System configuration PC System configuration Photodetector System configuration Raman excitation laser System configuration Scanner System configuration Software System configuration Spectrometer
Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder HE-Part Number-Nanofinder HE

Nanofinder HE

Available upon quote Laser wavelength (nm)
473~785
Wavelength range (cm-1)
<150~>4,000/<60~>4,000/<60~>3,000
Objective lens 100×NA0.95 (in air) (typical value)
・XY axis direction (nm): 200~500
・Z-axis direction (nm): 500~850
Within 1 pixel of CCD
Diffraction grating (G/mm): 1,800/75 (echelle)
Wavenumber resolution (cm-1): 0.43/0.1
Full width at half maximum of emission line
Diffraction grating (G/mm): 1,800/75 (echelle)
Wavenumber resolution (cm-1): 0.8/0.25
100×100×20 by piezo stage
*Large stages up to standard specifications 300 x 300 x 100 are also available.
3 ms or less per measurement point
(Includes all Raman spectrum data. CCD AD conversion rate: 3 MHz)
CW laser for Raman spectroscopy
Laser wavelength (nm): 473~785
Output (mW): 20~80
Spatial mode: TEM00
M^2:< 1.1~1.2
Line width (MHz): < 10~160
Polarization: straight line
Laser wavelength (nm)
473~785 (typical value)
Objective lens 150×NA1.25 (water immersion) (typical value)
・XY axis direction (nm): 180, 200
・Z-axis direction (nm): 400, 420
Cooling temperature: 100℃ (water cooling), 80℃ (air cooling) DU970P EMCCD
High-end model with electron multiplication (1~1,000) function
Equipped with high-speed 3MHz AD converter
*Ideal for high-speed, high-sensitivity measurements.
Diffraction grating (G/mm): 600/1,800/75 (Echelle) Spectral range on CCD light receiving surface
75.5/21.4/4.8nm
2,509/708/159 cm-1
Dispersion
0.047/0.0134/0.0031 nm/pixel
1.55/0.44/0.1 cm-1/pixel
150, 300, 600, 1,200, 1,800, 2,400, 3,600 G/mm, Echelle (75 G/mm) Independent control motor driven orthogonal slit variable width 0~2 mm 2 ports 550mm Can be equipped with 3 diffraction gratings Czernitana type Optical unit, spectrometer, microscope, multi-laser system, and controller all in one housing Achieves outstanding optical stability Upright, inverted, and transparent layouts are all selectable.
Bright field/fluorescence observation mode (optional), LED illumination, objective lens rotating turret, CCD camera for monitor, accessories
100× (NA0.7), 100× (NA0.95), 60× (NA0.9), 10×; Various selections available
For confocal Raman measurements in an upright microscope configuration, objective lens rotation is possible
Computer, LCD display (2 in AFM configuration) Cooled CCD/EMCCD detector (visible Raman spectroscopy), InGaAs detector (near-infrared Raman spectroscopy/photolumi spectroscopy), avalanche photodiode + time-correlated photon counting (fluorescence lifetime microimaging) Built-in up to 3 wavelengths, 1 external port Piezo stage (XYZ) ・Stepping motor stage (XY) ・AFM dedicated stage Advanced Nanofinder software set Built on granite substrate (f=55 cm, 2 exit ports, 3 diffraction gratings on motorized exchangeable turret)

Customers who viewed this product also viewed

Other products of Tokyo Instruments, Inc


View more products of Tokyo Instruments, Inc

About Company Handling This Product

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2024 Metoree