Spectroscopic measurement Confocal micro-Raman spectrometer, model pursuing high sensitivity and high spatial resolution 3D micro-laser Raman spectrometer Nanofinder30
Tokyo Instruments, Inc
About This Product
■EMCCD detector demo machine sales campaign for Raman spectroscopy equipment
We are offering a demonstration model of the EMCCD detector used in our Nanofinder FLEX microlaser Raman spectrometer at a special price. We also offer various CCD detector and spectrometer sets and Raman spectroscopy module sets at low prices.
■Overview: Confocal Raman spectrometer pursuing high sensitivity and high spatial resolution
The 3D microlaser Raman spectrometer Nanofinder30 is capable of 3D Raman imaging with a spatial resolution of less than 200nm in the plane direction and less than 500nm in the depth direction. Additionally, by adding a scanning probe microscope (SPM) head, microspectroscopic measurements and SPM measurements can be performed simultaneously.
Furthermore, near-field Raman spectroscopy measurements that can obtain a resolution of 50 nm or less in the plane direction are also possible (TERS*). In the semiconductor field, we provide silicon strain (strain Si) stress evaluation measurements. We also support complex systems that combine laser scanning units, streak cameras, etc.
*TERS (Tip Enhanced Raman Spectroscopy)
■What is TERS (Tip Enhanced Raman Spectroscopy)?
This is a laser Raman microscope that combines a regular laser Raman microscope and an atomic force microscope (AFM) to generate surface-enhanced Raman light. By using a sharp probe, Raman scattering is locally enhanced. This dramatically increases spatial resolution compared to regular laser Raman microscopes. The 3D microlaser Raman spectrometer Nanofinder30 can measure 50nm with spatial resolution 2D images.
■Features
・High sensitivity (4th order light of Si is detected within 1 minute)
・High-speed measurement
・High spatial resolution 130nm@364nm, 200nm@488nm, 50nm@near field
・Low irradiation laser
・High wavenumber resolution 0.5cm-1 (Echelle diffraction grating)
・Various customization possible
・Time-resolved measurement, cryostat, excitation laser selection, detection wavelength optimization, detector selection, etc.
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Product
Spectroscopic measurement Confocal micro-Raman spectrometer, model pursuing high sensitivity and high spatial resolution 3D micro-laser Raman spectrometer Nanofinder30
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Handling Company
Tokyo Instruments, Inc
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Categories
1 Models of Spectroscopic measurement Confocal micro-Raman spectrometer, model pursuing high sensitivity and high spatial resolution 3D micro-laser Raman spectrometer Nanofinder30
| Product Image | Part Number | Price (excluding tax) | Control/analysis computer/software-1 | Control/analysis computer/software-2 | Detector | Detector Electronically cooled CCD | Galvano scanner (optional) | Imaging spectrometer Number of exit ports | Imaging spectrometer Stray light rejection ratio | Imaging spectrometer diffraction grating | Imaging spectrometer focal length | Imaging spectrometer slit width | Irradiation laser (selection) -1 | Microscope section | Optical system (selection) | Other options | Overall performance | Piezo stage | Piezo stage X/Y | Piezo stage Z | Piezo stage position repeatability | Piezo stage stage load capacity | Sensitivity | Spatial resolution Numerical aperture N.A. | Spatial resolution Wavelength (nm) | Spatial resolution XY direction (nm) | Spatial resolution Z direction (nm) | Wavenumber range | Wavenumber resolution |
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Nanofinder30 |
Available upon quote |
・Control system is stored in a rack ・2D/3D image rotation, slicing at any position ・Spectrometer drive, slit control ・Laser switching mirror (3 types of lasers) ・Control of various filters and polarizers |
・Display of Raman spectrum ・Raman line wavenumber calibration ・Baseline correction ・Curve fitting: Spectral database analysis software can also be selected |
・APD (Avalanche Photodiode) ・PMT (photomultiplier tube) |
1,024×128 elements (26μm/element) (select from ultraviolet, visible, and near-infrared types) | X/Y: 100 μm (100x objective lens) 250 μm (40x objective lens) | 2 (Can be equipped with two types of detectors) | 1×10^-5 | Equipped with 4 pieces (automatic switching) 150, 200, 300, 600, 1,200, 1,800, 2,400, 2,800/mm, Echelle | 52cm | 0~1.5 mm (electric adjustment) | 325 nm, 364 nm, 442 nm, 458 nm, 488 nm, 514 nm, 532 nm, 633 nm, 785 nm |
・Upright type, inverted type (selection) ・CCD camera for monitor |
・Ultraviolet visible ・Visible near infrared ・Near infrared (equipped with optical components for polarization measurement, wave number calibration unit included, edge filter can be changed to notch filter) |
・Heating/cooling stage (-180℃~600℃) and others available ・Cryostat ・High temperature stage ・Time-resolved measurement: streak camera, TCSPC (time-correlated single photon counting method) ・Near-field Raman measurement |
・Optical components are fully controlled by PC ・Air spring type vibration isolation table |
A motor stage can also be installed and can be installed at the same time. | 100 μm (300 μm can also be selected) | 100 μm (100 μm can also be selected) | <30 nm closed loop | Up to 1kg | Measures Si Raman 4th peak within 1 minute/point (@488 nm, 5 mW) | 0.9/1.4 (oil immersion) | 364~785 | 130~390 | 330~800 | 50 cm-1~5,000 cm-1 (depending on the irradiation laser) | 0.5 cm-1~20 cm-1 (@1.5CCD element) |
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