Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder 30A (ADVANCED TYPE)
Tokyo Instruments, Inc
About This Product
■3D microlaser Raman spectrometer Nanofinder 30A (ADVANCED TYPE)
Spatial resolution of 200 nanometers, customizable to suit your application
■3D Microscope Laser Raman Spectrometer Nanofinder 30A Overview
This device can perform 3D Raman imaging and analysis with high spatial resolution of 0.2 μm or less in the horizontal direction (X, Y-axis resolution) and 0.5 μm or less in the depth direction (Z-axis resolution).
Raman analysis increases analytical power when combined with other analytical techniques. In order to meet the ever-changing needs of our customers, this equipment can be used not only as standard, but also in a way that can be expanded later, so it can be upgraded.
Examples include combinations with piezo stages, galvano scanners, cryostats, heating chambers, scanning probe microscopes (SPM), streak cameras, time-correlated single photons (TCSPC), and expansion to nonlinear Raman spectroscopy (CARS Raman spectroscopy). can.
By customizing it according to the customer's application, it becomes a complex Raman spectrometer with higher productivity. The software has been developed to be easier to use than before, allowing measurements to be performed in conjunction with various hardware, providing efficient data collection and clear analysis results.
We accept demo measurements. We have heard from our customers that they can collect data clearly. We also have a system in place for after-sales follow-up and maintenance services.
Nanofinder® series
■High-quality Raman spectroscopy and analysis evaluation with a spatial resolution of 200 nanometers
Twenty years ago, Tokyo Instruments pioneered the industry's first ``Raman imaging with a spatial resolution of 200 nanometers,'' and continues to strive for ``cutting-edge analysis and evaluation technology.''
■Features
・Using a platform with a high degree of freedom, it is possible to combine with various analysis methods
・Because the sample is irradiated with a weak excitation laser, damage is reduced and analysis is performed with high sensitivity and speed.
・Spatial resolution: 200nm (excitation laser 488nm, when using oil immersion lens)
・Wavenumber resolution: 0.22 cm-1 (Echelle diffraction grating)
・Non-destructive and easy measurement
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Product
Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder 30A (ADVANCED TYPE)
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Handling Company
Tokyo Instruments, Inc
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Categories
1 Models of Spectroscopic measurement 3D microlaser Raman spectrometer Nanofinder 30A (ADVANCED TYPE)
| Product Image | Part Number | Price (excluding tax) | Control/analysis computer/software-1 | Control/analysis computer/software-2 | Detector | Detector Electronically cooled CCD | Galvano scanner (optional) | Imaging spectrometer Number of exit ports | Imaging spectrometer Stray light rejection ratio | Imaging spectrometer diffraction grating | Imaging spectrometer focal length | Imaging spectrometer slit width | Irradiation laser (selection) -1 | Irradiation laser (selection) -2 | Microscope section | Optical system (selection) | Other options | Overall performance | Piezo stage | Piezo stage X/Y | Piezo stage Z | Piezo stage position repeatability | Piezo stage stage load capacity | Sensitivity | Spatial resolution Numerical aperture N.A. | Spatial resolution Wavelength | Spatial resolution XY direction | Spatial resolution Z direction | Wavenumber range | Wavenumber resolution |
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Nanofinder 30A (ADVANCED TYPE) |
Available upon quote |
・2D/3D image rotation, cross section display at any position ・Spectrometer drive (grating change), slit control ・Laser switching mirror (up to 5 types of lasers can be installed) ・Control of various filters and polarizers |
・Display of Raman spectrum ・Raman peak wavenumber calibration ・Baseline correction ・Curve fitting ・Can be equipped with spectral database software ・Can be linked with multivariate analysis software |
Single photon counting detector | 1,024×128 elements (26μm/element) ((Can be selected from ultraviolet, visible, near-infrared types, etc.) | X/Y: 80μm (100x objective lens), 200μm (40x objective lens) | 3 (up to 3 types of detectors can be installed) | 1×10^-5 | 4 pieces can be installed (automatic switching) | 52cm, 81cm |
0~1.5mm (electric) 50, 100, 150, 200, 300, 600, 1,200, 1,800, 2,400, 2,800, 3,600, 75 (Echelle) G/mm |
325nm, 364nm, 442nm, 458nm, 473nm, 488nm, 514nm, 532nm (Choose from irradiation laser (selection) -1, 2) |
633nm, 785nm 980nm, 1,064nm (others such as pulse laser can be installed) (Choose from irradiation laser (selection) -1, 2) |
・Upright type, inverted type (selection) ・Observation CCD camera (EMCCD etc. can also be installed) ・Differential interference observation, fluorescence observation, polarization observation, phase contrast observation *Optional |
・Ultraviolet-visible ・Visible-Near Infrared ・Ultraviolet-near infrared ・Optical element for polarization measurement ・Low wave number unit ・Auto focus unit ・Edge filter, notch filter ・Wave number calibration unit |
・Heating/cooling stage (-180℃~600℃) ・Cryostat ・Time-resolved measurement: Streak camera, TCSPC (time-correlated single photon counting method) ・Near-field Raman measurement TERS |
Control of optical components is fully automated by PC Air spring vibration isolation table |
Can also be combined with motor stage | 100μm (300μm can also be selected) | 100μm | <30nm closed loop | Up to 1kg | High sensitivity measurement of Si Raman 4th peak within 1 minute (@488nm, 5mW) | 0.9/1.4 (oil immersion) | 364~785nm | 130~390nm | 330~800nm | 50 cm-1~5,000 cm-1 (depending on the irradiation laser) | 0.22 cm-1~20 cm-1 (@1.5CCD element) |
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