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Spectrometer/Spectrometer Hyperspectral Imaging System V-EOS, S-EOSHandling Company
Tokyo Instruments, IncCategories
Image | Part Number | Price (excluding tax) | Spatial resolution | Measurement wavelength | Wavelength resolution | Standard FOV (can be customized) | Onboard sensor (selectable) | Spectroscopic method | Spectroscopic channel | Entrance slit | Dynamic range | Sampling spectral width |
---|---|---|---|---|---|---|---|---|---|---|---|---|
V-EOS |
Available upon quote |
2mm @1.2m with FOV of 1.85m×1.35m |
400~1,000nm |
2nm |
72° (horizontal) |
CCD, sCMOS, EMCCD |
Volume Bragg Grating |
Continuously variable |
None (simultaneous measurement of images within FOV) |
14 bit |
0.1 nm or more (programable) |
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Reviews shown here are reviews of companies.