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Spectrometer/Spectrometer Hyperspectral Imaging System V-EOS, S-EOS-V-EOS
Spectrometer/Spectrometer Hyperspectral Imaging System V-EOS, S-EOS-Tokyo Instruments, Inc

Spectrometer/Spectrometer Hyperspectral Imaging System V-EOS, S-EOS
Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

Response Rate

100.0%

Response Time

36.5hours


About This Product

■Hyperspectral imaging system V-EOS, S-EOS

Acquires high-resolution spectral image data in a wide field of view (visible and near-infrared), for high-precision inspection of stationary objects

■Product overview

Photon etc.'s hyperspectral imaging system is equipped with a volume-type transmission grating based on the proprietary technology "Volume Bragg Grating (VBG)" that can change the direction of only specific wavelengths, and spectrally separated by a tunable filter. A system for acquiring imaging. This hyperspectral imaging system equipped with "volume transmission grating", a proprietary technology developed by Photon etc., differs from the line scan type in that it can acquire spectral image data for each wavelength, providing wide-field, high-resolution spectral image data. It will be possible to obtain. In addition, by narrowing the measurement area, measurement wavelength range, and wavelength step width, spectral image data can be acquired at high speed.

■Features

・Image acquisition by wavelength using tunable filter ・Measurement wavelength: 3 types: 0.4-1.0μm, 0.9-1.7μm, 1.0-2.5μm

■Applications

・Drugs ・Food ·semiconductor ・Painting etc. inspection

  • Product

    Spectrometer/Spectrometer Hyperspectral Imaging System V-EOS, S-EOS

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1 Models of Spectrometer/Spectrometer Hyperspectral Imaging System V-EOS, S-EOS

Image Part Number Price (excluding tax) Spatial resolution Measurement wavelength Wavelength resolution Standard FOV (can be customized) Onboard sensor (selectable) Spectroscopic method Spectroscopic channel Entrance slit Dynamic range Sampling spectral width
Spectrometer/Spectrometer Hyperspectral Imaging System V-EOS, S-EOS-Part Number-V-EOS

V-EOS

Available upon quote

2mm @1.2m with FOV of 1.85m×1.35m

400~1,000nm

2nm

72° (horizontal)
50° (vertical)

CCD, sCMOS, EMCCD

Volume Bragg Grating

Continuously variable

None (simultaneous measurement of images within FOV)

14 bit

0.1 nm or more (programable)

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About Company Handling This Product

Response Rate

100.0%


Response Time

36.5hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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  • Japan

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