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  2. Next-generation photoelectron analyzer compatible with Momentum microscopy Electrostatic hemispherical photoelectron momentum analyzer KREIOS 150 MM (Tokyo Instruments, Inc)
Next-generation photoelectron analyzer compatible with Momentum microscopy Electrostatic hemispherical photoelectron momentum analyzer KREIOS 150 MM-KREIOS 150MM
Next-generation photoelectron analyzer compatible with Momentum microscopy Electrostatic hemispherical photoelectron momentum analyzer KREIOS 150 MM-Tokyo Instruments, Inc

Next-generation photoelectron analyzer compatible with Momentum microscopy Electrostatic hemispherical photoelectron momentum analyzer KREIOS 150 MM
Tokyo Instruments, Inc

About This Product

■Product overview

KREIOS150 MM is the latest "electrostatic hemispherical photoelectron analyzer". The electron detection optical system manufactured by SPECS uses the latest K microscope column jointly developed by Germany's University of Mainz and the Zumax-Planck Institute, achieving a photoelectron capture angle of ±90° without rotating the sample. Fermi surface mapping is now possible. Since the k microscope column can also be used as a high-performance PEEM, it is possible to perform μARPES measurements after determining the measurement position from the PEEM image. We also offer KREIOS MM and KREIOS MM Twin as models compatible with photoelectron momentum microscopes. It is also possible to mount a spin detector.

■Features

・Highest energy resolution: 25 meV (momentum microscope mode), 10 meV (spectroscopy mode) ・Angular resolution: < 0.1° ・Wavenumber resolution: < 0.01 Å^-1 ・Photoelectron uptake angle: ± 90° ・2D spin detector (optional)

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    Next-generation photoelectron analyzer compatible with Momentum microscopy Electrostatic hemispherical photoelectron momentum analyzer KREIOS 150 MM

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1 Models of Next-generation photoelectron analyzer compatible with Momentum microscopy Electrostatic hemispherical photoelectron momentum analyzer KREIOS 150 MM

Image Part Number Price (excluding tax) Angular/wavenumber resolution Spatial resolution (PEEM) Detector Highest energy resolution Mounting flange Working distance Lens intake angle Analyzer radius ΜARPES minimum field of view
Next-generation photoelectron analyzer compatible with Momentum microscopy Electrostatic hemispherical photoelectron momentum analyzer KREIOS 150 MM-Part Number-KREIOS 150MM

KREIOS 150MM

Available upon quote

0.1°/0.01 Å^-1

100nm

2D CCD, 2D DLD

< 15 meV

DN150CF

4~10mm

±90°

150mm

2 mm

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About Company Handling This Product

Tokyo Instruments, Inc

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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