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Photodetector/photoelectron spectroscopy analyzer X-ray/electron beam (CCD, MCP, etc.) High-speed MCP position/time detection system-DLD40
Photodetector/photoelectron spectroscopy analyzer X-ray/electron beam (CCD, MCP, etc.) High-speed MCP position/time detection system-Tokyo Instruments, Inc

Photodetector/photoelectron spectroscopy analyzer X-ray/electron beam (CCD, MCP, etc.) High-speed MCP position/time detection system
Tokyo Instruments, Inc

💻 Electronics & Electrical Use

Tokyo Instruments, Inc's Response Status

Response Rate

100.0%

Response Time

28.2hours

Relatively Fast Response


About This Product

■High-speed MCP position/time detection system

Detection of electrons, ions, and high-energy photons with MCP detector and delay line readout. Digital output device allows simultaneous measurement of position and time, high-speed time resolution

■Product overview

This is a high-speed position/time detection system for weak electrons, ions, X-rays, UV, and neutrons at the photon counting level that combines a high-sensitivity MCP detector and a unique delay line anode. Simultaneous measurement of position and time is possible without external equipment such as TAC.

■Delay line anode operating principle

In delay line anode detectors, the conductors are wound at 90° (60° for HEX types). When the secondary electrons converted by MCP hit the conductor, charge flows from that position toward both ends of the conductor. The time it takes for the charge to reach both ends of the conductor differs depending on the position where the secondary electron hits, and this time difference provides positional information. The HEX series has three conductors wound around it, so it can accurately detect position information in multi-hit cases where the timing interval is very narrow (10 ns or less) or in cases with a center hole.

■Features

・Unique delay line anode method ・Position/time measurement of weak charged particles at photon counting level ・DLD type (2-layer delay line) and HEX type (3-layer delay line) ・Position and time can be measured simultaneously without external devices such as TAC ・Select effective detection area from 40mm, 80mm, 120mm, 150mm ・DLD type has multi-pulse pair resolution from 15 ns to 10 ns ・HEX type has a resolution of 10 ns or less ・UHV compatible

■Applications

・UV, X-ray particle imaging ・Mass spectrometry (TOF, SIMS) ・Electron microscope (PEEM, TOF-PEEM) ・Multi-fragment image system ・Electron spectroscopy ・Residual gas beam profile monitor ・Materials science (RBS, RHEEM, X-ray and neutron diffraction), etc.

  • Product

    Photodetector/photoelectron spectroscopy analyzer X-ray/electron beam (CCD, MCP, etc.) High-speed MCP position/time detection system
  • Usage Scenarios

    Electronics & Electrical Use

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1 Models of Photodetector/photoelectron spectroscopy analyzer X-ray/electron beam (CCD, MCP, etc.) High-speed MCP position/time detection system

Image Part Number Price (excluding tax) Components (optional) High voltage power supply Components (optional) Standard feedthrough Components (optional) TDC Components (optional) CFD Detector height (mm) Detector diameter (mm) Time resolution (ns) Position resolution (mm) Number of MCPs MCP effective diameter (mm) MCP aspect ratio L/D
Photodetector/photoelectron spectroscopy analyzer X-ray/electron beam (CCD, MCP, etc.) High-speed MCP position/time detection system-Part Number-DLD40

DLD40

Available upon quote

HV2/4 (1 or 2 units) or BIASET3

FT12-TP or FT12-TP/100 (/xxx comes with mounting kit)

Time to Digital Converter (TDC)
TDC8HP

Constant fraction discriminator (CFD)
ATR19-6

30

94

<0.5

< 0.1

2

40

60:1

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About Company Handling This Product

Response Rate

100.0%


Response Time

28.2hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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  • Japan

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