Photodetector/photoelectron spectroscopy analyzer Photon counting detector/photon counter Near-infrared SPAD single photon detector
Tokyo Instruments, Inc
About This Product
■Near-infrared SPAD single photon detector
・High sensitivity from 900 to 1,700nm, low jitter, high count rate of 100MHz
・Small size, low cost, space/fiber injection selectable
■Product overview｜Near-infrared SPAD single photon detector
SPAD (Single Photon Avalanche Diode), which is an APD using InGaAs and can measure at the single photon level, has appeared. You can select the drive method from three types using the included software: gate mode, free gate mode, and free running mode. In addition, various settings such as quantum efficiency, cooling temperature, dead time, gate width, and count rate are possible. The incidence method can be selected from space incidence or fiber incidence.
■Features
・Wavelength range: 900 to 1,700 nm
・Photodetection element: SPAD sensor made of InGaAs material
・Timing jitter: 60 to 70 ps or less (FWHM)
・Maximum count rate: 100 MHz
・Output signal: NIM signal, 10 ns pulse width
・Software control: Various parameters can be adjusted
・Cooling method: All models Peltier cooling (electronic cooling)
・Injection method: space injection or fiber injection
■Applications
・Weak light single photon detection
・Picosecond time-resolved fluorescence lifetime measurement (TCSPC)
・Intensity correlation measurement (anti-bunching measurement)
・LiDER (Light Detection and Ranging) measurement
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Product
Photodetector/photoelectron spectroscopy analyzer Photon counting detector/photon counter Near-infrared SPAD single photon detector
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Handling Company
Tokyo Instruments, Inc
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Categories
1 Models of Photodetector/photoelectron spectroscopy analyzer Photon counting detector/photon counter Near-infrared SPAD single photon detector
| Product Image | Part Number | Price (excluding tax) | Bias voltage (Vex) range | Cooling temperature | Dark count (Vex=2V) | Delay setting (1 ns step) | Gate input amplitude | Gate input impedance | Gate input pulse width | Gate width (1 ns step) | Holdoff time (10 ns steps) | Integration time (20 ms steps) | Interface | Internal count rate (1 Hz step) | Light receiving area | NIM output signal (Ptohon OUT) -1 | NIM output signal (Ptohon OUT) -2 | NIM output signal (Ptohon OUT) -3 | Quantum efficiency @1,550 nm (Vex=7V) | TTL output signal (count rate) amplitude | TTL output signal (count rate) impedance | Timing jitter (FWHM) | Wavelength range |
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Near-infrared SPAD single photon detector spatial incidence model |
Available upon quote |
Free gate free run ・Min. 2V, Max. 5V fixed gate ・Min. 2V, Max. 7V |
Min. 225K Max. 243K |
Typ. 5kcps Max. 10kcps |
Min. 0 Max. 100ns |
Min. -2V Max. 2.5V |
Typ. 50Ω | Min. 800 ps |
Min. 1 us Max. 1.5ms |
Min. 1 us Max. 3,000us |
Min. 0.1s Max.60s |
USB2.0 |
Min. 100Hz Max. 100MHz |
Typ. 25um | Amplitude: Min. -800 mV, Max. 0 V | Pulse width: Typ. 10 ns | Impedance: Typ. 50Ω | Typ. 32% |
Min. 0V Max. 2.7V |
Typ. 50Ω |
Vex=7V ・Min. 100 ps, Typ. 130 ps Vex=4V ・Typ. 60 ps |
Min. 900nm Max. 1,700 nm |
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About Company Handling This Product
- Japan