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Optical measurement equipment Wavefront aberration measurement instrument OMI Single pass Shack Hartmann sensor-OMI UV-VIS-NIR
Optical measurement equipment Wavefront aberration measurement instrument OMI Single pass Shack Hartmann sensor-Asahiko Trading Co., Ltd.

Optical measurement equipment Wavefront aberration measurement instrument OMI Single pass Shack Hartmann sensor
Asahiko Trading Co., Ltd.

Asahiko Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

21.8hours

Relatively Fast Response


About This Product

■Summary

The OMI series of single-pass Shack Hartmann sensors is packed with cutting-edge technology from Spot Optics. A total of eight models are available, covering the UV to MWIR range. Users can easily perform their own calibration, providing high-precision single-pass measurements of transmitted and reflected wavefronts.

■Features

・Lineup that covers a wide range of wavelengths (UV, VIS, SWIR, MWIR, LWIR) ・High accuracy (λ/60) and high repeatability measurement accuracy (λ/1,000) ・Compact and lightweight housing ・Dedicated software for image acquisition and analysis Sensoft ・Zernike analysis (focal length, coma, spherical aberration, astigmatism...50th order or higher), PSF, MTF ・A wide variety of lens accessories to provide various beam diameters ・High-precision measurement through calibration at user site

■Accessories

・The wavefront sensor comes with accessories useful for measurement. ・External calibration unit Cal25 ・External electric calibration unit ECM25 ・External calibration pinhole light source PH50 ・Beam expander/beam compressor BE25, BE60 and BE120 ・Standard light source with mounting ・Flat mirror with mounting ・Objective lens ・Optical element mounting mount ・Electric stage

■Application

・Lens performance evaluation (MTF, EFL, BFL, Seidel aberration, surface shape, etc.) ・HUD, VR, AR ・Wavefront aberration measurement of optical components (surface accuracy, etc.) ・Alignment adjustment of optical systems and optical modules ・Stress measurement of reflective mirrors for astronomical telescopes ・Laser transmission wavefront measurement ・Contact lenses

■Multi-purpose Shack Hartmann sensor

・Accurate measurement with a single pass ・Optical elements, lasers, laser diodes ・Can test any focal length and diameter (when using accessories) ・Wide dynamic range ・For research and development and production ・Optimized for UV>NIR (300-1,100nm) wavelength range ・High sampling

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    Optical measurement equipment Wavefront aberration measurement instrument OMI Single pass Shack Hartmann sensor

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1 Models of Optical measurement equipment Wavefront aberration measurement instrument OMI Single pass Shack Hartmann sensor

Image Part Number Price (excluding tax) Accuracy and dynamic range Integration time (maximum) Measurement target Measurable laser diode power Standard lenslet array diameter and focal length Connection, A/D converter bit RMS repeatability of modal wavefront measurements Trigger Detector, wavelength range, cooling Software (control and analysis) RMS repeatability of Zernike coefficients Number of spots Camera 2: resolution, pixel size, chip size Camera 2: Acquisition speed Camera 1: resolution, pixel size, chip size Camera 1: Acquisition speed
Optical measurement equipment Wavefront aberration measurement instrument OMI Single pass Shack Hartmann sensor-Part Number-OMI UV-VIS-NIR

OMI UV-VIS-NIR

Available upon quote

Λ/20~λ/100 (depending on calibration), ±50λ

~800ms

Optical elements, lasers and laser diodes

A few mW. Higher outputs require power reduction system (available)

・φ=0.2mm, f=22mm For ultraviolet~visible range 300~750nm
・φ=0.2mm, f=11mm For near-infrared region 750~1,100nm

Gigabit Ethernet, 12 bit

<λ/100

Yes

CMOS (UV-VIS-NIR), uncooled

Sensoft 64bit for Win7, Win8.1, Win10

<2nm rms (λ/800 @1,050nm)

50×50 for spot size 10mm (UV-VIS-NIR)

2,048×2,048 pixels, 8μm each, 16×16mm2

15Hz

1,024×1,024 pixels, 10.6μm each, 10.9×10.9mm2

75Hz

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About Company Handling This Product

Response Rate

100.0%


Response Time

21.8hrs

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