World's fastest and highest performance COF/TAB automatic inspection equipment
Advanced Technology Research Institute Ltd.
About This Product
A state-of-the-art machine that uses original technology "Laser light diffraction/Light speed automatic difference method"
■Summary
This device is an inspection device that uses a completely new method. The principle is that the optical diffraction pattern that is generated when collimated light from a coherent laser is applied to a light-transmissive substrate to be inspected placed at the front focal plane of a convex lens is captured in advance on the reference substrate captured in the back focal plane of the lens. It generates an optical difference image between the optical diffraction pattern and performs inverse Fourier transform to extract only the defect image.
■Features of this device
・High-speed, high-definition detection processing using light velocity image Fourier transform difference method
・On-line inspection is possible due to high-speed processing of light velocity image differences, and inspections tailored to the production line are possible.
・High-definition image capture
・Highly reliable inspection that exceeds the accuracy of conventional methods is possible
・Quick creation of a reference master image (no CAD data required), Master creation time: 10 minutes
・Cost performance is one order of magnitude higher than conventional methods
- Possible to simplify and simplify the substrate tape feeding mechanism (high-speed and highly reliable detection processing)
・In principle, strict precision is not required for board positioning.
・Applicable to both COF and TAB substrates
■Other features
・Automatic drilling and engraving of good and defective products possible
・Enlarged monitor display of defect details and saving of logs
・Verify function not required (inspection result reproduction function built into the main unit)
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Product
World's fastest and highest performance COF/TAB automatic inspection equipment
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Handling Company
Advanced Technology Research Institute Ltd.
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Categories
1 Models of World's fastest and highest performance COF/TAB automatic inspection equipment
| Product Image | Part Number | Price (excluding tax) | Area Camera display resolution | Area Camera inspection speed | Detection resolution | Equipment dimensions | Equipment operation | Inspection compatible board dimensions | Inspection items | Inspection method | Inspection speed | Lighting equipment | Line Scanner display resolution | Line Scanner inspection speed | Number of CPUs | Number of cameras | Products to be inspected | Shooting camera | Test result output |
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COF/TAB automatic inspection equipment |
Available upon quote | 40μm/pixel, light scattering intensity image resolution 5μm | 1 second/sheet (160×105mm, 35mm width 4 rows, 3 rows) 360m/h=100mm/s (160mm width) | 2μm (resolution by optical diffraction) |
800W×800D×1,740H (mm) (Does not include transport section) |
TFT touch panel |
160mm×110mm;35mm Up to 4 rows and 3 rows of COF are possible. |
Short circuit, disconnection, protrusion, chipping Poor conductor line width and gap, etc. |
Laser light irradiation, reference substrate Fourier transform Automatic optical subtraction method using filters |
1 second/sheet (160mm×110mm; 35mm width 4 rows 3 rows COF) 360m/h |
LD: Irradiation wavelength Input = 660nm | 20μm/pixel (160×105),4.4μm/p (35x35) | 1 second/piece (160×105mm, 4 rows, 3 rows COF) 360m/h=100mm/s (160mm width) | 2 units (1 for management, 1 for parallel processing) | 1 unit |
COF substrate, TAB tape substrate On-line inspection possible |
Area Camera 4,000x2,672pixelLine Scanner 8,000pixel |
LCD color monitor display Defect detection coordinate information can be sent |
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