All Categories

History

Thermal shock device TSD-101-W-TSD−101−W
Thermal shock device TSD-101-W-ESPEC CORP.

Thermal shock device TSD-101-W
ESPEC CORP.

ESPEC CORP.'s Response Status

Response Rate

100.0%

Response Time

44.4hours


About This Product

■Elevating 2-zone test area

・A two-zone thermal shock device that perfectly fits domestic and international standard tests such as JIS60068-2-14 Na, MIL-STD-883, and JASO-D902. - Equipped with network instrumentation that allows you to monitor and manage the operating status of test equipment in remote locations from your desk. ・With excellent temperature distribution performance, it applies uniform temperature stress to the sample and can be used in a wide range of fields from research and development to inspection and production fields.

■Temperature distribution performance

It evenly distributes the air flow within the test area and achieves excellent temperature distribution performance. This applies uniform thermal stress to the sample and minimizes variation in test results between samples.

■Reduction of test time

Since the test area is switched between the high temperature chamber and the low temperature chamber by moving up and down, the set temperature is reached quickly and the test time is shortened.

■Can measure sample temperature

Equipped with a sample temperature trigger that counts the exposure time or immediately moves to the next step after the sample temperature reaches the set value. Achieves shortening of total test time and reliable arrival of sample temperature. It can also be connected to a temperature recorder to record the temperature of the sample and test area.

■+150℃↔−65℃, temperature recovery time is 5 minutes.

The TSD has high performance, allowing the sample to return to temperature within 15 minutes (when the set temperature is +155℃ and -68℃, and the plastic molded IC sample is 10kg). The small type TSE achieves temperature recovery within 5 minutes with two-zone upwind control.

■Test area movement time within 10 seconds

Compatible with test standards such as MIL-STD-883 and JISC60068-2-14Na.

■Stable temperature distribution performance Reduces vibration and shock

It evenly distributes the air flow into the test area and has excellent temperature distribution performance. Provides uniform thermal stress to minimize variation in test results between samples.

■Reduce vibration and shock

Automatically switches to soft move mode to reduce vibration and shock to the sample when moving between the high temperature chamber and the low temperature chamber in the test area.

■Protect the sample

Test area Fall prevention mechanism Equipped with a brake mechanism for the drive unit in case the drive stops inside the tank. Prevents samples from falling from the test area.

  • Product

    Thermal shock device TSD-101-W

Share this product


140+ people viewing


Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of Thermal shock device TSD-101-W

Image Part Number Price (excluding tax) High temperature exposure temperature range Noise Power supply Operable ambient temperature range Mass Sample basket load capacity Water supply amount Water supply pressure Temperature recovery time Temperature fluctuation Temperature fall time Temperature rise time Conditions Maximum load current Method Exhaust heat amount Room temperature return time Foreign law Compressor Refrigerant Cooler Freezing method Low temperature exposure temperature range Preheating upper limit Precooling lower limit Test area load capacity Test area travel time Test area dimensions Test area content Test area
Thermal shock device TSD-101-W-Part Number-TSD−101−W

TSD−101−W

Available upon quote

+60℃~+205℃

65dB or less

AC200V 3φ 3W 50/60Hz (Power supply voltage fluctuation: ±10% of rating)

+5℃~+40℃

Approximately 1,100kg

5kg/1 piece (equally distributed load)

2,050L/h (Reference water temperature + 25℃), 3,400L/h (Reference water temperature + 32℃)

0.2Mpa Gauge~0.5Mpa Gauge (2~5kg/cm2G)

Sample IC temperature within 15 minutes

±1.0℃

Room temperature → −77℃ (Setting: −77℃) Within 90 minutes

Room temperature → +200℃ (Setting: +205℃) within 90 minutes

・High temperature exposure +150℃ to +55℃ or less ・Ambient temperature +23℃
・Power supply voltage Specified voltage ・Sample Plastic mold IC 10kg

64A

2-zone method by moving the sample up and down

12,600kJ/h (3,000kcal/h)

Within 90 minutes

W1,100×H1,885×D1,965mm

Scroll type 3.73kW (5HP) 2 units

R-23, R-404A [Can be changed to low GWP refrigerant R-449A]

Plate fin cooler, regenerator

Mechanical dual refrigeration system (water-cooled condenser)

-77℃~0℃

+205℃

-77℃

30kg (when using test area floor and heavy object sample shelf (optional))

Within 10 seconds (high temperature incubator ⇔ low temperature incubator)

W710×H345×D410mm

100L

2 tier shelf supports (4 tiers can be installed)

Customers who viewed this product also viewed

Reviews shown here are reviews of companies.

See More Impact Testers Products

Other products of ESPEC CORP.

Reviews shown here are reviews of companies.


View more products of ESPEC CORP.

About Company Handling This Product

Response Rate

100.0%


Response Time

44.4hrs

Company Overview

ESPEC CORP., founded in 1947 and based in Osaka, Japan, is a manufacturer of environmental test chambers, list...

See More

  • Japan

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2025 Metoree