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Contact angle meter, special solution for wafers up to 200mm SURFTENS HL-SURFTENS HL
Contact angle meter, special solution for wafers up to 200mm SURFTENS HL-Irie Co., Ltd.

Contact angle meter, special solution for wafers up to 200mm SURFTENS HL
Irie Co., Ltd.

Irie Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

13.9hours

Relatively Fast Response


About This Product

■SURFTENS HL

The SURFTENS HL contact angle meter is designed for process control in the semiconductor industry and research, especially in wafer coating and photolithography processes.

■Features

・Quick and easy measurement of contact angle ・Space-saving structure ・Special table structure for quick mapping of contact angle distribution on wafer ・Software that allows intuitive operation ・Excellent documentation of measurement results with protocols and video images - Optionally available for use with laptop or desktop PC

■Application

Tuning the wetting behavior of silicon wafers is a standard process step in semiconductor technology for process characterization, adjustment of technical parameters, and production control. Therefore, it is essential to objectively and accurately measure the contact angle and surface free energy before and after the conditioning process. For this purpose, a robust and easy-to-use contact angle measurement device is required. SURFTENS HL was developed to meet the needs of semiconductor technology and research. It is easy to operate and can be used by anyone with a short training period. Due to manual operation, we have achieved an attractive price. SURFTENS HL is used not only for standard process control but also for research and development. In conjunction with the software “SURFTENS”, you can measure the contact angle and surface free energy of solids. Excellent documentation capabilities aid in quality assurance and research collaboration.

■Measurement software

Basically, the measurement software SURFTENS allows a fully automated measurement of the contact angle of stuck droplets by various fitting methods of the droplet shape. Droplets are automatically detected using image processing. If contrast is important, additional options for droplet detection are provided, such as manual setting of the baseline and fully manual measurement of the contact angle by setting measurement points on the monitor. The following measurement and setting functions are provided as additional functions. ・Real-time display of current contact angle with live video image ・Automatic measurement and diagram display of time-dependent contact angle (cycle time can be freely selected up to 50 times/s) ・Measurement of advancing and receding contact angles in live video images ・Simultaneous measurement of left and right contact angles ・Droplet volume detection during and after dropping

  • Product

    Contact angle meter, special solution for wafers up to 200mm SURFTENS HL

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1 Models of Contact angle meter, special solution for wafers up to 200mm SURFTENS HL

Image Part Number Price (excluding tax) Specimen thickness Sample stand Drop volume reproducibility Inclination angle of measurement optical system Contact angle measurement range Resolution/accuracy of contact angle measurement Dosing system (standard) Dosing system (alternative) Light source Optical system (standard equipment) Software Camera (standard equipment)
Contact angle meter, special solution for wafers up to 200mm SURFTENS HL-Part Number-SURFTENS HL

SURFTENS HL

Available upon quote

0~5mm

Diameter 200mm or 300mm x/φ positioning

0.1μl

Fixed at approximately 1°

1°~180°

±0.05°/ ±0.5 on live images using contact angle standard

Manual single dose unit

Manual double dosing unit or fully automatic dosing system

Long life light pad

1x magnification, electric focus possible

SURFTENS for Windows

Monochrome USB 2.0 camera, 440,000 pixels

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About Company Handling This Product

Response Rate

100.0%


Response Time

13.9hrs


Company Review

4.8
  • Japan

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