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Scratch/dig automatic inspection device OptiLUX SDHandling Company
IR System Co., Ltd.| Image | Part Number | Price (excluding tax) | Drive method | Weight (measuring part only) | Maximum allowable slope | Measurement lens | Measurement principle | Measurement reproducibility | Measurement scratch standard | Field of view (FOV) | Movement max | Movement resolution | Pixel resolution | Illumination | Compliant standards | Minimum measurement size | Maximum measurement range | Positioning | Position repeatability | Scan speed | Size (measuring part only) | Camera | Working Distance | Accessories |
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OptiLUX SD |
Available upon quote |
Ball screw (manual), brushless servo motor |
55kg |
+/-2° |
Mitutoyo infinity correction objective lens, x2 (fixed), depth of focus 184um, single lens WD34mm |
Uniform illumination, fully automatic dark field micrometer |
99.90% |
Scratch: 10-20-40-60-80, Dig: 5-10-20-40-50 |
5.63×5.63mm |
XY 300mm, Z 50mm (other specifications available on request) |
XY 0.5um, Z 0.1um |
2.75um |
LED array uniform light source (color temperature 5,500K) |
MIL-PRF-13830B, ANSI/OEOSC OP 1.002:2009 |
8um |
300×300mm However, measurement area/shape can be set within this range |
Rotary encoder |
XY ±1um, Z ±0.75um |
>25㎟/sec |
680×680×612mm |
Monochrome 2,048 x 2,048 pixels, 10-bit |
15mm (as device) |
Dedicated Windows7 (64bit) PC, dedicated software, dedicated stage and controller |
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