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  2. Semiconductor Manufacturing
  3. Silicon Wafers
  4. Semiconductor grade silicon single crystal X-ray measuring device DX-7ANG-3 (OSTECH Co., Ltd.)
Semiconductor grade silicon single crystal X-ray measuring device DX-7ANG-3-DX-7ANG-3
Semiconductor grade silicon single crystal X-ray measuring device DX-7ANG-3-OSTECH Co., Ltd.

Semiconductor grade silicon single crystal X-ray measuring device DX-7ANG-3
OSTECH Co., Ltd.

About This Product

This device has measuring tables on both sides, one side measures the notch of the wafer, and the other side measures the end face and reference edge of the ingot and wafer.

  • Product

    Semiconductor grade silicon single crystal X-ray measuring device DX-7ANG-3

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1 Models of Semiconductor grade silicon single crystal X-ray measuring device DX-7ANG-3

Image Part Number Price (excluding tax) Measuring crystal planes Measurement accuracy Minimum reading Wafer thickness Wafer/Ingot Notch tank angle value
Semiconductor grade silicon single crystal X-ray measuring device DX-7ANG-3-Part Number-DX-7ANG-3

DX-7ANG-3

Available upon quote

100, 111, 110 and various measurement angles

±30″

1″

Over 100um

125~457mm, ±1mm

45°,90°,180°

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About Company Handling This Product

OSTECH Co., Ltd.

  • Japan

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Silicon Wafers
Silicon Wafers　OSTECH Co., Ltd.
OSTECH Co., Ltd.

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