Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type
Nittoseiko Analytech Co., Ltd
About This Product
Suitable for measuring film thickness distribution of ITO films, various metal thin films, etc., and resistivity distribution of transfer belts.
■Features
・Measurement, calculation, data processing, and 3D graph output can be automated. (The board size can be up to 650 x 650 mm.)
・Displays [Ω], [Ω/□], [Ωcm], and [S/cm] in a three-dimensional graph.
・Measurement position setting can be done in 3 ways with one touch: grid input and sequential input.
- Can be used for a wide range of purposes, from research and development to on-line sampling inspections.
・There are two types ranging from low resistivity to high resistivity.
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Product
Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type
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Handling Company
Nittoseiko Analytech Co., Ltd
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Categories
1 Models of Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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MCP-S620 type |
Available upon quote |
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