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Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type-MCP-S620 type
Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type-Nittoseiko Analytech Co., Ltd

Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type
Nittoseiko Analytech Co., Ltd

Nittoseiko Analytech Co., Ltd's Response Status

Response Rate

100.0%

Response Time

64.4hours


About This Product

Suitable for measuring film thickness distribution of ITO films, various metal thin films, etc., and resistivity distribution of transfer belts.

■Features

・Measurement, calculation, data processing, and 3D graph output can be automated. (The board size can be up to 650 x 650 mm.) ・Displays [Ω], [Ω/□], [Ωcm], and [S/cm] in a three-dimensional graph. ・Measurement position setting can be done in 3 ways with one touch: grid input and sequential input. - Can be used for a wide range of purposes, from research and development to on-line sampling inspections. ・There are two types ranging from low resistivity to high resistivity.

  • Product

    Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type

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1 Models of Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type

Image Part Number Price (excluding tax)
Automatic resistivity measurement system Large mapping system MCP-S620 type/MCP-S521 type-Part Number-MCP-S620 type

MCP-S620 type

Available upon quote

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About Company Handling This Product

Response Rate

100.0%


Response Time

64.4hrs

Company Overview

Nittoseiko Analytech Co., Ltd, founded in April 1979 and based in Yamato, Kanagawa, is a manufacturer and supp...

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