Low resistivity automatic measurement system Compact mapping system MCP-S330 type
Nittoseiko Analytech Co., Ltd
About This Product
Precise measurement of surface resistivity [Ω/▢] and volume resistivity [Ω・cm] without being affected by sample shape
■Features
・Variations in film thickness and composition of conductive films, metals, ITO thin films, etc. can be seen at a glance.
・Capable of mapping samples up to 300mm square and continuous measurement of multiple samples
・Can measure from 10^-4 to 10^+7Ω range by connecting with Loresta GX
・Full automation of measurement, calculation, data processing, and 3D graph output
■Variations in film thickness and composition of conductive films, metals, ITO thin films, etc. can be seen at a glance.
- Display devices (liquid crystals and organic EL) are required to have faster response and higher definition, and the uniformity of electrode substrates has become even more important.
・Surface resistivity depends on the material. When the material is uniform, the thicker the film, the lower the surface resistivity.
- In the thin film field, film thickness variations are evaluated by surface resistivity mapping.
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Product
Low resistivity automatic measurement system Compact mapping system MCP-S330 type
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Handling Company
Nittoseiko Analytech Co., Ltd
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Categories
1 Models of Low resistivity automatic measurement system Compact mapping system MCP-S330 type
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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MCP-S330 type |
Available upon quote |
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