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FDC-W2520Handling Company
JFE Techno Research Co., Ltd.Categories
| Image | Price (excluding tax) | Equipment size | Measurement film thickness range | Measurement speed | Measurement width | Repeatability | Spatial resolution |
|---|---|---|---|---|---|---|---|
|
|
Available upon quote | W320×D220×H850mm | 100nm~20μm *Depends on material and conditions. | Approximately 20 lines/second *Depends on material and conditions. | 100mm *Depending on the target object, a wider range of applications is possible. | 3σ＜1.0nm *With a calibrated SiO2 film on a 1 μm thick Si wafer. | 0.13mm |
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