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  5. High frequency test head GURF series
Test socket test head for IC devices-Japan Connect Industry Co., Ltd.

High frequency test head GURF series | Test socket test head for IC devices
Japan Connect Industry Co., Ltd.

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Model Description

Capable of measuring devices from DC to 10GHz. Adopts a short probe pin that is highly reliable among our products. SMA connector output allows easy connection to measuring instruments. ■Features ・Low cost ・Custom design available ・You can order from one unit.

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  • Part Number

    High frequency test head GURF series

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Test socket test head for IC devices High frequency test head GURF series's performance table

Image Price (excluding tax) Compatible device Durability Frequency range RF insertion loss RF return loss
Test socket test head for IC devices-Part Number-High frequency test head GURF series Available upon quote DBM, RF AMP, PLL, VCO, RF module, etc. More than 5000 times DC~18GHz DC~10GHz 1.0dB DC~10GHz 10.0dB

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Japan Connect Industry Co., Ltd.

  • Japan

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BGA Scokets

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