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Test socket test head for IC devices-Japan Connect Industry Co., Ltd.

Price (excluding tax)

Estimate Required

Japan Connect Industry Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

62.6hours


Model Description

Capable of measuring devices from DC to 10GHz. Adopts a short probe pin that is highly reliable among our products. SMA connector output allows easy connection to measuring instruments. ■Features ・Low cost ・Custom design available ・You can order from one unit.


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Compatible device

Durability

Frequency range

RF insertion loss

RF return loss

See all 2 models in list
  • Part Number

    High frequency test head GURF series

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Test socket test head for IC devices High frequency test head GURF series's performance table

Image Price (excluding tax) Compatible device Durability Frequency range RF insertion loss RF return loss
Test socket test head for IC devices-Part Number-High frequency test head GURF series Available upon quote DBM, RF AMP, PLL, VCO, RF module, etc. More than 5000 times DC~18GHz DC~10GHz 1.0dB DC~10GHz 10.0dB

There are 2 models for this product.

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About Company Handling This Product

Response Rate

100.0%


Response Time

62.6hrs


Company Review

5.0
  • Japan

Category of this product

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