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  4. Test socket burn-in test for IC devices
  5. GGI series
Test socket burn-in test for IC devices-Japan Connect Industry Co., Ltd.

GGI series | Test socket burn-in test for IC devices
Japan Connect Industry Co., Ltd.

Price (excluding tax)

Estimate Required

Japan Connect Industry Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

62.6hours

Company Review

5.0

Model Description

Custom, 22-35GHz, RF probe pin socket Test socket intended for use in high frequency bands. The contact method uses short probe pins, which are among the most reliable among our products. ■Features ・Supports various device types ・Excellent high frequency characteristics ・High durability ・Compatible with thermal environment ・Custom design available (clamshell available)

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See all 10 models in list

  • Part Number

    GGI series

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Test socket burn-in test for IC devices GGI series's performance table

Image Price (excluding tax) Compatible device
Test socket burn-in test for IC devices-Part Number-GGI series Available upon quote BGA, LGA, QFN, QFP, etc.

There are 10 models for this product.

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About Company Handling This Product

Japan Connect Industry Co., Ltd.

Response Rate

100.0%

Response Time

62.6hrs

Company Review

5.0
  • Japan

Category of this product

Test Sockets

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