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  4. Test socket burn-in test for IC devices
  5. GU41 series (1mm pitch)
Test socket burn-in test for IC devices-Japan Connect Industry Co., Ltd.

GU41 series (1mm pitch) | Test socket burn-in test for IC devices
Japan Connect Industry Co., Ltd.

Price (excluding tax)

Estimate Required

Japan Connect Industry Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

62.6hours

Company Review

5.0

Model Description

BGA (FPGA), LGA compatible, 1.0mm/0.039" pitch, 18x18contact max ■Features ・Can be used for burn-in test ・High reliability ・Low cost ・Quick delivery possible ・Operating temperature range: -40~+150℃ (typ.)

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Compatible device

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  • Part Number

    GU41 series (1mm pitch)

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Test socket burn-in test for IC devices GU41 series (1mm pitch)'s performance table

Image Price (excluding tax) Compatible device
Test socket burn-in test for IC devices-Part Number-GU41 series (1mm pitch) Available upon quote FTGB196, 256-Pin FBGA, FT256/FTG256, FG256/FGG256, FG320/FGG320, 324-Pin FBGA

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About Company Handling This Product

Japan Connect Industry Co., Ltd.

Response Rate

100.0%

Response Time

62.6hrs

Company Review

5.0
  • Japan

Category of this product

Test Sockets

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