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A coaxial structure test socket that can be used in the high frequency band 60GHz. The contact method uses short probe pins, which are among the most reliable among our products. We will manufacture it according to the terminal assignment of the device.
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Compatible device
Operating temperature range
Pitch
Contact resistance
Capacitance
Characteristic impedance
Frequency
Probe pin type
Self inductance
Durability
Insertion force/per pin
Mutual capacitance
Mutual inductance
Rated current/per pin
Part Number
GRC seriesHandling Company
Japan Connect Industry Co., Ltd.Categories
Image | Price (excluding tax) | Capacitance | Characteristic impedance | Compatible device | Contact resistance | Frequency | Operating temperature range | Pitch | Probe pin type | Self inductance |
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Available upon quote | 0.26pF (0.8mm pitch, measured value with SG9 parameters) | 50Ω | BGA, LGA, QFN etc. | 100mΩmax | -1.0dB@60GHz (0.8mm pitch, measured value with SG9 parameters) | -55℃~+120℃ | 0.8mm (0.5mm) ~ | RF/POWER/GROUND | 0.81nH (0.8mm pitch, measured value with SG9 parameters) |
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