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  4. Test socket for IC devices System level test
  5. GGI series
Test socket for IC devices System level test-Japan Connect Industry Co., Ltd.

GGI series | Test socket for IC devices System level test
Japan Connect Industry Co., Ltd.

Price (excluding tax)

Estimate Required

Japan Connect Industry Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

62.6hours

Company Review

5.0

Model Description

Test socket intended for use in high frequency bands. The contact method uses short probe pins, which are among the most reliable among our products. ■Features - Compatible with various device types. ・Excellent high frequency characteristics. ・High durability. - Compatible with thermal environments. ・Custom design compatible (clamshell compatible).

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Compatible device

Operating temperature range

Pitch

Contact resistance

Capacitance

Characteristic impedance

Frequency

Probe pin type

Self inductance

Durability

Insertion force/per pin

Mutual capacitance

Mutual inductance

Rated current/per pin

See all 10 models in list

  • Part Number

    GGI series

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Test socket for IC devices System level test GGI series's performance table

Image Price (excluding tax) Compatible device
Test socket for IC devices System level test-Part Number-GGI series Available upon quote BGA, LGA, QFN, QFP, etc.

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About Company Handling This Product

Japan Connect Industry Co., Ltd.

Response Rate

100.0%

Response Time

62.6hrs

Company Review

5.0
  • Japan

Category of this product

BGA Scokets

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