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OmniProbe400 is the 9th generation nanomanipulator Adopting the latest technology piezo drive system, it achieves the highest nanoscale positioning accuracy in its class. This nanomanipulator is ideal for applications where flexibility is important, as well as high resolution and high throughput. ■4^3 performance Nanoscale manipulation and inspection in the SEM and preparation of various lift-out TEM samples in the FIB can be easily performed while maintaining an optimized working distance. ・4 degrees of freedom (X, Y, Z, R) ・Minimum working distance of 4mm ・Four excellent functions: encoder resolution, motor resolution, repeatability, and linearity Features ■Accuracy Nanometer-resolution piezo actuators and 10nm closed-loop encoders provide industry-leading accuracy, linearity, and smooth motion. ■Speed Automatic control allows you to get results with minimal steps. ・Reproducibility of insertion position eliminates the need for chip realignment. - Change tips in 3 minutes without venting the chamber. - Concentric rotation allows for sharpening and cleaning of the tip tip, as well as repositioning of the sample. ・Safely and accurately navigate to saved or parked positions close to the sample. ■Accurate closed-loop feedback control OmniProbe400 uses closed-loop control for smooth movement, accuracy, and advanced integration. Furthermore, for extremely high motion resolution, the OmniProbe400 comes standard with a motor-controlled concentric rotation mechanism and quick tip exchange within the chamber. ・Non-pneumatic insertion and retraction provides gentle control even for unstable samples ・High reliability, linearity, and reproducibility ・Movement in any diagonal direction (omnidirectionality) ・Navigate at right angles to any sample tilt ・Quickly position the sample at a specific angle
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Backside Thinning
Built-in temperature sensor
Concentric rotation
Cryogenic lift out
EBAC measurement
EBIC measurement
Encoder resolution
In situ chip exchange
Insertion reproducibility
Linearity
Maximum speed
Minimum speed
Neutralization of charge
On-Tip analysis
Plan-view
Pretreatment of atom probe tomography samples
Site specific lift-out
Vent free plan-view
Voltage contrast imaging
Part Number
OmniProbe 400Handling Company
Oxford Instruments Ltd.Categories
| Image | Price (excluding tax) | Backside Thinning | Built-in temperature sensor | Concentric rotation | Cryogenic lift out | EBAC measurement | EBIC measurement | Encoder resolution | In situ chip exchange | Insertion reproducibility | Linearity | Maximum speed | Minimum speed | Neutralization of charge | On-Tip analysis | Plan-view | Pretreatment of atom probe tomography samples | Site specific lift-out | Vent free plan-view | Voltage contrast imaging |
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Available upon quote | P | ✘ | ✔ | ✘ | O | O | 10nm | ✔ | 2μm | 250nm | 500μm/s | 10nm/s | ✔ | ✔ | ✔ | ✔ | ✔ | ✔ | ✔ |
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