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The OmniProbe 350 is a 3-axis, port-mounted manipulator with a piezo motor with closed-loop feedback that is ideal for routine TEM lamella creation. Precise and intuitive controls allow for fast and reliable operation without risk of damage or sample loss. You can perform various tasks. ■OmniProbe 350 based on 9th generation probe design Achieve precise nanoscale control in a compact port-mounted footprint with minimal interference with other detectors and accessories. Equipped with a stable probe platform and sub-nanometer piezoelectric motors, the current generation probe has low vibration, low drift, and excellent positioning accuracy, with an intuitive user interface that adjusts the direction of movement to the image. are combined. The result is class-leading performance for routine liftouts, and when combined with a variable tilt grid holder, the OmniProbe 350 can handle planar and TKD samples without directly handling grids or complex multi-stage liftouts. You can create one. Features ■Excellent linearity ・Safely lift out without hitting the side of the groove ・Realizes high-speed creation of TEM lamella using fine grooves ■Intuitive user interface Control that directly reflects the movement of the probe in the electron microscope image ■Smooth continuous operation The lamella preparation workflow requires physical contact of the probes, but the smooth movement allows this to occur without the risk of dropping or damaging the sample. ■Accurate movement (including position saving) ・Move from fully retracted state to operating position with one click ・Save user-defined working positions ■Stable probe platform The stable Omniprobe platform minimizes vibration and drift during idle, reducing these risks.
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Backside Thinning
Built-in temperature sensor
Concentric rotation
Cryogenic lift out
EBAC measurement
EBIC measurement
Encoder resolution
In situ chip exchange
Insertion reproducibility
Linearity
Maximum speed
Minimum speed
Neutralization of charge
On-Tip analysis
Plan-view
Pretreatment of atom probe tomography samples
Site specific lift-out
Vent free plan-view
Voltage contrast imaging
Part Number
OmniProbe 350Handling Company
Oxford Instruments Ltd.Categories
| Image | Price (excluding tax) | Backside Thinning | Built-in temperature sensor | Concentric rotation | Cryogenic lift out | EBAC measurement | EBIC measurement | Encoder resolution | In situ chip exchange | Insertion reproducibility | Linearity | Maximum speed | Minimum speed | Neutralization of charge | On-Tip analysis | Plan-view | Pretreatment of atom probe tomography samples | Site specific lift-out | Vent free plan-view | Voltage contrast imaging |
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Available upon quote | ✘ | ✘ | ✘ | ✘ | O | O | <50nm | O | 5μm | 500nm | 250μm/s | 50nm/s | ✔ | ✘ | P | P | ✔ | ✘ | ✔ |
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Reviews shown here are reviews of companies.
