All Categories
History
Price (excluding tax)
Oxford Instruments' OmniProbeCryo Liftout expands the scope of liftout operations for cryogenic samples, including high-pressure frozen samples. For Cryo-FIB probes, liftout operations are possible even with cryogenic samples cooled to -180° using third-party CryoSystems. In the future, cryo-TEM probes and cryo-atom probes will be able to perform nanoanalysis on a variety of new samples and in a variety of industries. Features ■Expanding research fields ・Achieving high quality for samples that were previously difficult or impossible to analyze at high resolution ・Materials that react with Ga+ or are sensitive to heating ・Aqueous samples and liquid-solid interfaces ・Batteries, bioimplants, hydrogels ・Large samples for Plunge-Freezing ■Obtain high-quality images and results ・Improve data quality by reducing artifacts caused by Ga+ FIB ・Suppress chemical reactions (e.g. III-V materials) ・Suppress temperature effects (e.g. polymers) ■Reconstruction of tomography data and improvement of accuracy Achieving good ultrastructure preservation by avoiding sample compression induced by cryo-ultramicrotome ・Improve the quality of TEM and atom probe analysis of large cells and tissues
You can search for other models from each index. The displayed value is the value of the currently selected part number.
Backside Thinning
Built-in temperature sensor
Concentric rotation
Cryogenic lift out
EBAC measurement
EBIC measurement
Encoder resolution
In situ chip exchange
Insertion reproducibility
Linearity
Maximum speed
Minimum speed
Neutralization of charge
On-Tip analysis
Plan-view
Pretreatment of atom probe tomography samples
Site specific lift-out
Vent free plan-view
Voltage contrast imaging
Part Number
Cryo lift-outHandling Company
Oxford Instruments Ltd.Categories
| Image | Price (excluding tax) | Backside Thinning | Built-in temperature sensor | Concentric rotation | Cryogenic lift out | EBAC measurement | EBIC measurement | Encoder resolution | In situ chip exchange | Insertion reproducibility | Linearity | Maximum speed | Minimum speed | Neutralization of charge | On-Tip analysis | Plan-view | Pretreatment of atom probe tomography samples | Site specific lift-out | Vent free plan-view | Voltage contrast imaging |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
Available upon quote | ✘ | ✔ | ✘ | ✔ | ✘ | ✘ | <50nm | ✘ | 15μm* | 500nm | 250μm/s | 50nm/s | ✔ | ✘ | P | P | ✔ | ✘ | ✘ |
Reviews shown here are reviews of companies.
Reviews shown here are reviews of companies.
