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C-Swift+ is the newest detector in the CMOS detector family, designed for routine materials analysis and high-throughput sample analysis. Like the SymmetryS3 detector, it features innovative EBSD detector features including a CMOS sensor designed for EBSD. ■Features ・Speed at indexing >2,000pps (guaranteed value) ・Speed 250pps when collecting 622x512 pixel EBSD pattern ・Excellent sensitivity due to optical fiber, extremely high sensitivity even under low energy and low current ・Distortion-free images ■Summary C-Swift+ is a class-leading high-throughput EBSD detector. As with the Symmetry S3 detector, the C-Swift+ features a customized CMOS sensor that combines speed and sensitivity to deliver high-quality results even in the most challenging materials. C-Swift+'s maximum speed of 2,000pps is also achieved with good pattern resolution (156x128 pixels). It has four times more pixels than CCD-based detectors operating at comparable speeds, ensuring highly accurate indexing and high hit rates on every sample. Together with distortion-free optics and the powerful indexing algorithm of AZtec software, it enables angular accuracy of better than 0.05°. For applications that require high pattern quality, it can collect patterns with a pixel resolution of 622x512 at speeds up to 250pps, making it ideal for complex crystalline samples and detailed analysis of crystalline phases. This detector is designed for fast and efficient sample evaluation. From the unique proximity sensor to the integrated forward scatter detector, every component of the system is designed for maximum performance and ease of operation, making it a standard EBSD tool in every research institution. Masu.
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C-Swift+Handling Company
Oxford Instruments Ltd.| Image | Price (excluding tax) |
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