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High performance EBSD detector with CMOS technology-Oxford Instruments Ltd.

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C-Swift is the newest detector in the CMOS detector family, designed for routine materials analysis and high-throughput sample analysis. Like Symmetry, it features innovative EBSD detector capabilities, including a CMOS sensor designed for EBSD. ■Features ・Speed ​​of indexing 1,000pps (guaranteed value) ・Speed ​​250pps when collecting 622x512 pixel EBSD pattern ・Extremely high sensitivity even in low energy and low current analysis ・Distortion-free images ■Summary C-Swift is a class-leading high-throughput EBSD detector. Like the Symmetry detector, C-Swift features a customized CMOS sensor that combines speed and sensitivity to deliver high-quality results even in the most challenging materials. C-Swift's top speed of 1000pps is also achieved with good pattern resolution (156x128 pixels). It has four times more pixels than CCD-based detectors operating at comparable speeds, ensuring highly accurate indexing and high hit rates on every sample. Combined with distortion-free optics and AZtec software's powerful indexing algorithms, it enables angular accuracy of less than 0.05°. For applications that require high-quality patterns, it can collect patterns with 622x512 pixel resolution at speeds up to 250pps, making it ideal for complex crystalline samples and detailed analysis of crystalline phases. The detector is designed for fast and effective sample evaluation. From the unique proximity sensor to the integrated forward scatter detector, every component of the system is designed for maximum performance and ease of operation, making it a standard EBSD tool in all research institutions.


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    C-Swift

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High performance EBSD detector with CMOS technology C-Swift's performance table

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High performance EBSD detector with CMOS technology-Part Number-C-Swift Available upon quote

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