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C-Nano+ is an excellent entry-level EBSD detector. The same innovative technology found in the SymmetryS3 detector is also integrated into the C-Nano+, providing best-in-class performance even at the entry level. C-Nano+ is suitable for any type of specimen and its high pixel resolution makes it ideal not only for detailed strain analysis but also for routine work in complex and challenging materials analysis. ■Summary C-Nano+ is an EBSD detector designed for all materials and applications. Equipped with a customized CMOS sensor, it achieves up to 600pps acquisition speed with an excellent 312x256 pixel resolution pattern. Compared to comparable CCD-based detectors, it is approximately 5-6 times faster for patterns with more than 4 times the number of pixels. The result is the ability to obtain excellent data quality even with the most challenging materials. The C-Nano+ design uses a lens-free optical fiber system to ensure excellent sensitivity and sub-pixel level distortion. This detector is ideal for detailed strain analysis where high quality and clear patterns are required. The sensitivity of C-Nano+ guarantees the fastest analysis speed even at low currents (3 nA or less), and even at the highest pixel resolution, the sensitivity of 900 pps/nA makes it possible to analyze samples and nanocrystalline materials that are sensitive to electron beam irradiation. The C-Nano+ takes advantage of Oxford Instruments' new design of CMOS detectors. It also has a proximity sensor to prevent accidental collisions that can lead to expensive repairs. A detector that provides reliable results every time. ■Features ・Pattern resolution 1244x1024 pixels (full) - Ideal for high resolution ESBD ・Best pattern acquisition speed in its class >600pps ・Supports analysis under low energy and low current with excellent sensitivity due to optical fiber ・Distortion-free images
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C-Nano+Handling Company
Oxford Instruments Ltd.Image | Price (excluding tax) |
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