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C-Nano is a versatile EBSD detector. The same innovative technology found in the Symmetry detector is also integrated into the C-Nano, providing best-in-class performance even at the entry level. C-Nano is adaptable to any type of specimen, and its high pixel resolution makes it ideal for detailed strain analysis as well as routine work with complex and challenging materials. overview ■EBSD detector designed for all materials and applications Equipped with a customized CMOS sensor that achieves up to 400pps acquisition speed with an excellent 312x256 pixel resolution pattern. - Approximately 3 times faster for patterns with more than 4 times the number of pixels compared to equivalent CCD-based detectors. The result is the ability to obtain excellent data quality even with the most challenging materials. ■Optical design inside C-Nano It guarantees excellent sensitivity and sub-pixel level distortion, making it the perfect detector for detailed strain analysis where high quality and clear patterns are required. In addition, the sensitivity guarantees the highest analysis speed even at low beam currents (3 nA or less), making it possible to analyze beam-sensitive samples and nanocrystalline materials. ■Detector that gives you the results you need at any time It benefits from a new design of Oxford Instruments' CMOS detector, including a proximity sensor to proactively avoid costly accidental collisions. ■Features ・Pattern resolution 1244x1024 pixels (full) - Ideal for high resolution ESBD ・Best-in-class pattern acquisition speed of 400pps ・Extremely high sensitivity even in low energy and low current analysis ・Distortion-free images
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C-NanoHandling Company
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