Bruker Corporation

■Dimension series Bruker's Dimension Icon® atomic force microscopy (AFM) system provides the highest performance, functionality...

8 models listed

• Measuring Equipment

• Coordinate Measuring Machines

■The only probe manufacturer as an AFM equipment manufacturer Bruker is the only company that manufactures both a range of high...

6 models listed

■Fully automatic white interference measurement system for 300mm wafers Optical interference microscope EFEM handler solution f...

• Observation Equipment

• Microscopes

Atomic force microscope for life sciences JPK Bio AFM ■Scanner It has a scan range of up to 15um in the Z direction, which is ...

7 models listed

• Observation Equipment

• Atomic Force Microscopes

■Optical profiler Bruker is a pioneer in surface profile measurement equipment that uses white light interferometry, and provid...

3 models listed

• Observation Equipment

• Microscopes

■AFM infrared spectroscopy system The long-awaited new generation nanoscale infrared spectroscopy system Dimension IconIR Dimen...

4 models listed

• Observation Equipment

• Atomic Force Microscopes

■Electron microscope built-in system Bruker's electron microscope built-in nanoindentation system (Picoindenter) can be incorpo...

4 models listed

• Observation Equipment

• Transmission Electron Microscopes

■CO₂ precision dry cleaning equipment for masks ・Removal of repair residue for photomasks and particles by dry cleaning ・Cont...

• Cleaning Agents & Equipment

• Cleaning Systems

Atomic force microscope (material AFM) small platform.

3 models listed

• Observation Equipment

• Scanning Probe Microscopes

■High quality photomask femtosecond laser repair equipment ・Photomask repair system for cutting-edge semiconductor devices ・U...

• Semiconductor Manufacturing

• Semiconductor Manufacturing Equipment Component & Part Machining

■XRD equipment for quality control of compound semiconductors The Bruker QC3/QC-Velox instrument is designed specifically as an...

• Testing Equipment

• X-ray Inspection System

■Innovative nanomechanical characterization system for various material areas Bruker offers nanoindenters for nanomechanical an...

3 models listed

■Cell mechanics research tool Optical tweezers Quantification of molecular, cellular, and microrheological processes: Dual beam...

2 models listed

• Observation Equipment

• Scanning Probe Microscopes

300mmXY stage compatible/high performance model

2 models listed

• Observation Equipment

• Microscopes

■Multi-functional friction friction testing machine Bruker's Universal Mechanical Tester (UMT) platform has been the most widel...

• Meters & Instruments

• Friction Testers

AutoAFM (large automatic atomic force microscope). ■Large AutoAFM (automatic atomic force microscope) compatible with 300mm wa...

• Observation Equipment

• Scanning Probe Microscopes

Compatible with 650mmXY stage (for large panel board applications) ■White light interference microscope for mounting board onl...

• Observation Equipment

• Microscopes

■CO2 dry cleaning equipment for wafers ・Particle removal by CO2 precision dry cleaning for wafers ・By adopting an optimized u...

• Semiconductor Manufacturing

• Semiconductor Cleaning Equipment

■X-ray topography equipment that automatically detects notch and bevel defects Bruker JV Sensus is a fab X-ray topography syste...

• Testing Equipment

• X-ray Inspection System

■High-speed XRP&XRF measurement for metal film thickness and composition evaluation of patterned wafers The Bruker Sirius RF-T ...

• Analyzers

• X-Ray Fluorescence (XRF) Analyzers

■AutoAFM (fully automatic atomic force microscope) for photomasks Insight AFP PM is a fully automated atomic force microscope f...

• Observation Equipment

• Scanning Probe Microscopes

■Crystal defect visualization device/X-ray topography The Bruker JV QCTT instrument is a comprehensive solution that provides c...

• Measuring Equipment

• X-Ray Diffractometers

Compatible with 300mm XY stage (for large heavy objects) ■White light interference microscope for large samples This is a whit...

• Observation Equipment

• Microscopes

■Fully automatic/multipurpose XRD device for thin film analysis The Bruker JV-DX instrument is the latest instrument that can f...

• Measuring Equipment

• X-Ray Diffractometers

This is an optional item for the atomic force microscope (Material AFM).

2 models listed

The TriboLab HD Brake Material Friction Tester is specifically designed to handle cutting-edge brake development research that ...

• Meters & Instruments

• Friction Testers

■AutoAFM (Fully automatic atomic force profiler) Insight CAP is a fully automatic AFM for CMP and Etch process evaluation. In a...

• Observation Equipment

• Scanning Probe Microscopes

■High-precision nanomachining repair equipment ・High-precision modification of photomasks for cutting-edge semiconductor devic...

■CMP process/material property evaluation system TriboLab CMP is based on Bruker's highly robust friction and wear tester UMT T...

• Semiconductor Manufacturing

• Chemical Mechanical Polishing (CMP) Machines