2 frequency independent cleaning method assassing device-Assessing device
2 frequency independent cleaning method assassing device-Japan Create Co., Ltd.

2 frequency independent cleaning method assassing device
Japan Create Co., Ltd.


About This Product

■ Overview This is a mass -produced device that can manually process up to 8 inch substrates in full automatic. It is a versatile device that enables etching, assessing and ionic cleaning by switching gas species and plasma mode. ■ Characteristics ・ Switching between RIE mode and DP mode is possible ・ Metal contamination reduction by special surface treatment ・ Footprint ・ 2 frequency independent cleaning method ■ Use ·semiconductor ・ MEMS ・ Electronic components

  • Product

    2 frequency independent cleaning method assassing device




*Please note that we may not be able to accommodate sample requests.

1 Models of 2 frequency independent cleaning method assassing device

Product Image Part Number Price (excluding tax) Board size Control operation Data logging Plasma sauce Pressure control Process gas Transportation of the board Vacuum exhaust option
2 frequency independent cleaning method assassing device-Part Number-Assessing device

Assessing device

Available upon quote Maximum φ8 inch Control: PLC
Operation: Touch panel or PC
External memory or PC CCP type APC control F, CL2, AR, O2, etc. Air or vacuum transport robot Low vacuum process: MBP + DP
Takamasa Process: TMP + DP
2 frequency independent cleaning method, ultra -low temperature cooling stage, light emitting analysis system, gas detector, cylinder cabinet, etc.

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About Company Handling This Product

Japan Create Co., Ltd.

  • Japan
  • Since 1963
  • 40 employees

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