History

Oxford Instruments Ltd.

  • Japan
Oxford Instruments Ltd. Website
Oxford Instruments Ltd.

Products Handled By Oxford Instruments Ltd.

Search by Category


Oxford Instruments Ltd.

Windowless EDS detector Ultim® Extreme

2520+ people viewing

Last viewed: 4 hours ago

■Summary The Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra-high resolution FEG-SEM applications, en...

Oxford Instruments Ltd.

Silicon Drift Detector Ultim® Max

1990+ people viewing

Last viewed: 1 day ago

■Summary ・Ultim Max is the next generation silicon drift detector (SDD). - Largest sensor size combined with Extreme electroni...

Oxford Instruments Ltd.

Windowless Silicon Drift Detector Sensor X-MaxN TSR

1840+ people viewing

■Summary -This windowless silicon drift detector sensor for TEM applications can achieve detection solid angles ranging from 0....

Oxford Instruments Ltd.

Equipment that breaks the optical diffraction limit alpha300S–SNOM scanning near-field optical microscope

1090+ people viewing

Last viewed: 11 hours ago

■A device that breaks the optical diffraction limit The alpha300 S is a user-friendly instrument that combines confocal microsc...

Oxford Instruments Ltd.

Complete combination of Raman imaging and SEM RISE – SEM Raman combined equipment

1070+ people viewing

Last viewed: 5 minutes ago

RISE is a revolutionary technology that combines confocal Raman microscopy and SEM. RISE can link structural and chemical compo...

Oxford Instruments Ltd.

Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device

1030+ people viewing

Last viewed: 12 hours ago

■An epoch-making device that allows you to observe shape images and Raman images with one device. AFM Raman, which has become w...

Oxford Instruments Ltd.

AFM Jupiter XR Atomic Force Microscope (AFM/SPM) with excellent basic performance

1030+ people viewing

Last viewed: 13 hours ago

■Summary Jupiter XR is an atomic force microscope (AFM/SPM) that can handle large samples, and is an AFM with excellent basic p...

Oxford Instruments Ltd.

Achieving high-speed etching rates PlasmaPro 100 Cobra ICP RIE etching system

980+ people viewing

Last viewed: 18 hours ago

■Summary The PlasmaPro 100 Cobra ICP RIE system uses high-density inductively coupled plasma to achieve fast etch rates. This p...

Oxford Instruments Ltd.

Raman/near-field optical microscope combination device alpha300RS – Raman SNOM combination device

940+ people viewing

Last viewed: 14 hours ago

■Raman/near-field optical microscope complex equipment For advanced research purposes, the alpha300RS can perform confocal Rama...

Oxford Instruments Ltd.

Experience a new level of automation alpha300apyron – Automated Raman Imaging Microscopy

880+ people viewing

■Next generation alpha300apyron – Experience a new level of automation The alpha300apyron is the highest-end Raman imaging syst...

Oxford Instruments Ltd.

Easy way to start Raman alpha300access – Entry model Raman microscope

840+ people viewing

Last viewed: 1 day ago

■Easily start Raman – upgrade to full system possible ・A system that can perform spot Raman spectrum measurement and Raman map...

Oxford Instruments Ltd.

Direct measurement of cantilever deflection Laser interferometric displacement measurement (IDS)

820+ people viewing

Last viewed: 15 hours ago

■Features Interferometric Displacement Sensor (IDS) is an option for Cypher AFM/SPM that measures cantilever deflection ( defle...

Oxford Instruments Ltd.

Establishing a firm position alpha300R – Raman imaging microscope

810+ people viewing

WITec's Raman microscope alpha300R has long been recognized as a state-of-the-art imaging system, and continuous development bo...

Oxford Instruments Ltd.

Excellent homogeneity & maximum flexibility Ionfab 300 IBE

770+ people viewing

Last viewed: 18 hours ago

■Summary It has maximum flexibility with excellent homogeneity and is suitable for a wide range of application areas. Our syste...

Oxford Instruments Ltd.

The ultimate benchtop confocal microscope BC43

760+ people viewing

Last viewed: 2 hours ago

■Space-saving and stunning performance Andor's new benchtop confocal microscope can deliver stunning images at the push of a bu...

Oxford Instruments Ltd.

High flexibility in precursor, process gas, and hardware configuration FlexAL ALD atomic layer deposition system

760+ people viewing

Last viewed: 1 day ago

FlexAL ALD (Atomic Layer Deposition) systems offer a wide range of optimized, high-quality plasma and thermal ALD processes wit...

Oxford Instruments Ltd.

Measure Raman and surface topography in one pass Topographic Raman Imaging TrueSurface

720+ people viewing

Last viewed: 11 hours ago

■Measure Raman and surface topography in one pass WITec's patented TrueSurface method allows Raman imaging to be performed alon...

Oxford Instruments Ltd.

Capable of observing liquid samples and large samples alpha300Ri – Inverted Raman Imaging Microscope

690+ people viewing

■Liquid samples and large samples can be observed from below. Raman images can be acquired using an inverted optical system. Th...

Oxford Instruments Ltd.

Platform for DRIE applications PlasmaPro 100 Estrelas DRIE

690+ people viewing

The PlasmaPro 100 Estrelas platform is designed for total flexibility for deep reactive ion etching (DRIE) applications. We can...

Oxford Instruments Ltd.

High-speed remote plasma ALD equipment Atomfab ALD atomic deposition system

690+ people viewing

Last viewed: 9 hours ago

Atomfab enables plasma ALD processes for high-speed, low-damage, low-cost-of-ownership manufacturing for GaN power/RF devices. ...

Oxford Instruments Ltd.

Wave fully focusing Wave spectrometer with Roland circular geometry and curved spectroscopic crystal

660+ people viewing

Last viewed: 2 hours ago

■Uses a fully condensing wave spectrometer using Roland circular geometry and a curved spectroscopic crystal. ・High peak-to-ba...

Oxford Instruments Ltd.

SDD detector for TEM X-MaxN 100TLE

660+ people viewing

Last viewed: 1 day ago

The X-MaxN 100TLE TEM SDD detector is the ideal solution for field emission and aberration corrected TEM applications at the fo...

Oxford Instruments Ltd.

Detector Xplore for routine analysis in SEM

640+ people viewing

Last viewed: 3 hours ago

Xplore is a next generation EDS detector ideal for routine analysis in SEM. The detector has a sensor area of ​​30mm2 and 15mm2...

Oxford Instruments Ltd.

Single wafer ICP RIE etching system PlasmaPro 100 Polaris ICP RIE

630+ people viewing

PlasmaPro 100 Polaris is a single-wafer etch system that provides a smart solution with the etch performance you need to stay c...

Oxford Instruments Ltd.

Nanoscale electrical characterization Conductive AFM (ORCA)

630+ people viewing

■Summary - ORCA™ conductive AFM probe holder allows conductive AFM imaging and I-V measurements on all MFP-3D AFM/SPMs. -Standa...

Oxford Instruments Ltd.

Cryogenic Raman imaging cryoRaman

630+ people viewing

CryoRaman enables Raman imaging measurements at extremely low temperatures with unparalleled spatial resolution. It was develop...

Oxford Instruments Ltd.

High flux output Pinnacles 50kV Microfocus X-ray source

630+ people viewing

Last viewed: 3 hours ago

■Summary Pinnacles 50kV Microfocus X-ray sources are developed for applications requiring high resolution with a wide field of ...

Oxford Instruments Ltd.

SDD X-MaxN 80T for TEM

620+ people viewing

The X-MaxN series of SDDs for TEM leverages new sensor elements, new electronics, and innovative packaging to deliver truly "ne...

Profile

Country Japan
Website Oxford Instruments Ltd. Website

Products

5 Oxford Instruments Ltd.'s products are listed.


This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2026 Metoree