Park Systems Japan Co., Ltd.'s Company Profile and Products
Profile
| Country | Japan |
|---|---|
| Founded | 1997 |
| Website | Park Systems Japan Co., Ltd. Website |
Products Handled By Park Systems Japan Co., Ltd.
37 registered products of Park Systems Japan Co., Ltd.
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Park Systems Japan Co., Ltd.
Park FX40 automated atomic force microscope equipped with next-generation new features
■Next-generation technology to accelerate research and development ・Adopts the first dual camera system in research AFM histor...
Park Systems Japan Co., Ltd.
The most accurate and easy-to-use atomic force microscope (AFM) Park NX10
Park NX10 provides reliable data at the highest nanoscale resolution. It can be easily operated at every stage, from sample set...
Park Systems Japan Co., Ltd.
The most economical research grade AFM Park NX7 with flexible sample handling
Park NX7 is the most economical AFM, featuring Park Systems' cutting-edge technology and designed with the same attention to de...
Park Systems Japan Co., Ltd.
Park NX12 is a versatile microscopy platform for analytical chemists and public facilities.
Park NX12 is a device that integrates the sample stage of an inverted optical microscope with Park Systems' highly versatile an...
Park Systems Japan Co., Ltd.
Automated nanometer measurement equipment for wafer measurement and analysis Park NX20 300mm
The Park NX20 300mm is the industry's first atomic force microscope (AFM) for large samples that fully automates measurements o...
Park Systems Japan Co., Ltd.
Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.
As an FA engineer, you are expected to find results, but of course errors and mistakes caused by machines cannot be tolerated. ...
Park Systems Japan Co., Ltd.
Significantly improve productivity with highly versatile AFM Park NX20 Lite
The Park NX20 Lite has many unique features that make it ideal for collaborative laboratories, multivariate analysis, and wafer...
Park Systems Japan Co., Ltd.
Vacuum environment scanning suitable for failure analysis applications Park NX-Hivac
■NX-Hivac automatic vacuum control The pumping and evacuation process to the optimum vacuum condition is logically and visually...
Park Systems Japan Co., Ltd.
Standard sample for calibration of atomic force microscope AFM Tip Characterizer (AFMTC)
The AFMTC sample consists of 10 ultrafine trenches (10-50 nm) and 50 nm separated lines. This calibration sample is provided to...
Park Systems Japan Co., Ltd.
Calibration standard sample for scanning electron microscopy measurements High Magnification Calibrator (HMC)
The HMC sample consists of a series of lines offering five different width and pitch standards. This calibration sample provide...
Park Systems Japan Co., Ltd.
The only AFM for wafer fabs with automatic defect inspection function Park NX-Wafer
Park NX-Wafer is an industry-leading automated AFM measurement system for semiconductor and related fabrication. Enabling wafe...
Park Systems Japan Co., Ltd.
Fully automatic industrial AFM Park NX-3DM for high-resolution 3D metrology
Park Systems introduces the innovative Park 3DM Series, a fully automated AFM system designed for overhang profiles, high-resol...
Park Systems Japan Co., Ltd.
AFM Park NX-HDM ideal for media and board manufacturing
Identifying nanoscale defects is a very time-consuming process for engineers working with media and flat substrates. Park NX-HD...
Park Systems Japan Co., Ltd.
EUV mask repair by AFM Park NX-Mask
Park NX-Mask is a new generation photomask repair system that supports the miniaturization of devices and the increasing comple...
Park Systems Japan Co., Ltd.
Park NX-Hybrid WLI, the world's first hybrid semiconductor measurement device that combines atomic force microscope and white light interference technology
Park NX-Hybrid WLI is the world's first AFM system with a built-in white light interferometer for measurement, quality assuranc...
Park Systems Japan Co., Ltd.
Nanoscale infrared spectrometer Park NX-IR for chemical analysis and materials imaging
The Park NX-IR is a combination of a nanoscale infrared (IR) spectrometer and an atomic force microscope (AFM) for chemical and...
Park Systems Japan Co., Ltd.
Nanoscale infrared spectroscopy system for 300mm semiconductor wafer Park NX-IR R300
Park NX-IR R300 is a nanoscale infrared spectroscopy system compatible with semiconductor wafers up to 300mm. In addition to ch...
Park Systems Japan Co., Ltd.
Visualize thin films Imaging ellipsometer Accurion EP4
Imaging Ellipsometer EP4 is a product that combines ellipsometry and microscopy. EP4 can evaluate optical properties such as t...
Park Systems Japan Co., Ltd.
Referenced Spectroscopic Ellipsometer: RSE
The Referenced Spectroscopic Ellipsometer (RSE) is an ellipsometer-based reflectance meter designed for high-speed film thickne...
Park Systems Japan Co., Ltd.
Live view overview Brewster angle microscope Accurion UltraBAM
The UltraBAM is a Brewster angle microscope designed for gas-liquid interface measurements. It can also be used on solid substr...
Park Systems Japan Co., Ltd.
Surface Inspection Metrology of Nanofilms (SIMON)
SIMON is specially designed for regular measurement tasks in imaging ellipsometry. The simple user interface and robustness of...
Park Systems Japan Co., Ltd.
Compact benchtop vibration isolation table Accurion i4 Series
i4 is a state-of-the-art active anti-vibration system. Ideal for isolating high-resolution measurement equipment from building ...
Park Systems Japan Co., Ltd.
Ultra-compact and high-end active anti-vibration Accurion Nano Series
The Nano series combines high-end active vibration isolation with ultra-compact dimensions and is adopted for vibration isolati...
Park Systems Japan Co., Ltd.
Element-based modular vibration isolation system Accurion Vario Series
The Vario system is an element-based modular vibration isolation system consisting of at least two vibration isolation elements...
Park Systems Japan Co., Ltd.
Active vibration isolation table workstation i4
Workstation_i4 is designed for use with an optical microscope/microscope/SPM combination. The surface is surrounded by a scratc...
Park Systems Japan Co., Ltd.
Active vibration isolation table workstation_Vario
The workstation_Vario comes with a steel frame with an embedded optical breadboard as a work surface. As an extension, the surr...
Park Systems Japan Co., Ltd.
Atomic force microscope image processing and data analysis software for Park AFM Park SmartAnalysis™
Park SmartAnalysis™ is atomic force microscope image processing and data analysis software for Park AFM. Next-generation image ...
Park Systems Japan Co., Ltd.
Park SmartScan™ brings the power and versatility of AFM technology to everyone
Park SmartScan™ is Park Systems' innovative operating software for AFMs. Automatic mode allows even beginners to perform high-q...
Park Systems Japan Co., Ltd.
Park SmartLitho™ with an intuitive user interface for nanolithography and nanomanipulation
SmartScan™ automatic mode automatically performs all necessary imaging operations and intelligently determines optimal image qu...