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Oxford Instruments Ltd.

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Oxford Instruments Ltd.

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Oxford Instruments Ltd.

Windowless EDS detector Ultim® Extreme

2250+ people viewing

Last viewed: 9 hours ago

■Summary The Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra-high resolution FEG-SEM applications, en...

Oxford Instruments Ltd.

Silicon Drift Detector Ultim® Max

1720+ people viewing

Last viewed: 34 minutes ago

■Summary ・Ultim Max is the next generation silicon drift detector (SDD). - Largest sensor size combined with Extreme electroni...

Oxford Instruments Ltd.

Windowless Silicon Drift Detector Sensor X-MaxN TSR

1680+ people viewing

Last viewed: 19 hours ago

■Summary -This windowless silicon drift detector sensor for TEM applications can achieve detection solid angles ranging from 0....

Oxford Instruments Ltd.

Equipment that breaks the optical diffraction limit alpha300S–SNOM scanning near-field optical microscope

950+ people viewing

■A device that breaks the optical diffraction limit The alpha300 S is a user-friendly instrument that combines confocal microsc...

Oxford Instruments Ltd.

Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope

880+ people viewing

Last viewed: 14 hours ago

■Nanoscale surface observation WITec's alpha300A atomic force microscope is a reliable, high-quality nanoscale imaging system i...

Oxford Instruments Ltd.

Complete combination of Raman imaging and SEM RISE – SEM Raman combined equipment

880+ people viewing

Last viewed: 10 hours ago

RISE is a revolutionary technology that combines confocal Raman microscopy and SEM. RISE can link structural and chemical compo...

Oxford Instruments Ltd.

AFM Jupiter XR Atomic Force Microscope (AFM/SPM) with excellent basic performance

870+ people viewing

Last viewed: 10 hours ago

■Summary Jupiter XR is an atomic force microscope (AFM/SPM) that can handle large samples, and is an AFM with excellent basic p...

Oxford Instruments Ltd.

Observe shape images and Raman images with one device alpha300 RA – AFM Raman combined device

830+ people viewing

Last viewed: 1 day ago

■An epoch-making device that allows you to observe shape images and Raman images with one device. AFM Raman, which has become w...

Oxford Instruments Ltd.

Achieving high-speed etching rates PlasmaPro 100 Cobra ICP RIE etching system

790+ people viewing

Last viewed: 32 minutes ago

■Summary The PlasmaPro 100 Cobra ICP RIE system uses high-density inductively coupled plasma to achieve fast etch rates. This p...

Oxford Instruments Ltd.

Raman/near-field optical microscope combination device alpha300RS – Raman SNOM combination device

760+ people viewing

Last viewed: 4 hours ago

■Raman/near-field optical microscope complex equipment For advanced research purposes, the alpha300RS can perform confocal Rama...

Oxford Instruments Ltd.

Experience a new level of automation alpha300apyron – Automated Raman Imaging Microscopy

710+ people viewing

Last viewed: 1 day ago

■Next generation alpha300apyron – Experience a new level of automation The alpha300apyron is the highest-end Raman imaging syst...

Oxford Instruments Ltd.

Easy way to start Raman alpha300access – Entry model Raman microscope

690+ people viewing

Last viewed: 1 day ago

■Easily start Raman – upgrade to full system possible ・A system that can perform spot Raman spectrum measurement and Raman map...

Oxford Instruments Ltd.

Establishing a firm position alpha300R – Raman imaging microscope

680+ people viewing

WITec's Raman microscope alpha300R has long been recognized as a state-of-the-art imaging system, and continuous development bo...

Oxford Instruments Ltd.

Mechanical property measurement (nanomechanics) & thermal property measurement Laser interference displacement measurement

630+ people viewing

Last viewed: 1 hour ago

■Features Interferometric Displacement Sensor (IDS) is an option for Cypher AFM/SPM that measures cantilever deflection ( defle...

Oxford Instruments Ltd.

Direct measurement of cantilever deflection Laser interferometric displacement measurement (IDS)

630+ people viewing

Last viewed: 6 hours ago

■Features Interferometric Displacement Sensor (IDS) is an option for Cypher AFM/SPM that measures cantilever deflection ( defle...

Oxford Instruments Ltd.

Excellent homogeneity & maximum flexibility Ionfab 300 IBE

610+ people viewing

Last viewed: 1 day ago

■Summary It has maximum flexibility with excellent homogeneity and is suitable for a wide range of application areas. Our syste...

Oxford Instruments Ltd.

The ultimate benchtop confocal microscope BC43

600+ people viewing

Last viewed: 7 hours ago

■Space-saving and stunning performance Andor's new benchtop confocal microscope can deliver stunning images at the push of a bu...

Oxford Instruments Ltd.

Measure Raman and surface topography in one pass Topographic Raman Imaging TrueSurface

600+ people viewing

Last viewed: 20 hours ago

■Measure Raman and surface topography in one pass WITec's patented TrueSurface method allows Raman imaging to be performed alon...

Oxford Instruments Ltd.

High flexibility in precursor, process gas, and hardware configuration FlexAL ALD atomic layer deposition system

590+ people viewing

Last viewed: 1 day ago

FlexAL ALD (Atomic Layer Deposition) systems offer a wide range of optimized, high-quality plasma and thermal ALD processes wit...

Oxford Instruments Ltd.

Capable of observing liquid samples and large samples alpha300Ri – Inverted Raman Imaging Microscope

570+ people viewing

Last viewed: 1 day ago

■Liquid samples and large samples can be observed from below. Raman images can be acquired using an inverted optical system. Th...

Oxford Instruments Ltd.

Platform for DRIE applications PlasmaPro 100 Estrelas DRIE

550+ people viewing

Last viewed: 4 hours ago

The PlasmaPro 100 Estrelas platform is designed for total flexibility for deep reactive ion etching (DRIE) applications. We can...

Oxford Instruments Ltd.

Wave fully focusing Wave spectrometer with Roland circular geometry and curved spectroscopic crystal

550+ people viewing

Last viewed: 1 day ago

■Uses a fully condensing wave spectrometer using Roland circular geometry and a curved spectroscopic crystal. ・High peak-to-ba...

Oxford Instruments Ltd.

SDD detector for TEM X-MaxN 100TLE

540+ people viewing

Last viewed: 4 hours ago

The X-MaxN 100TLE TEM SDD detector is the ideal solution for field emission and aberration corrected TEM applications at the fo...

Oxford Instruments Ltd.

Compact and versatile etch and deposition solution PlasmaPro 80 PECVD

540+ people viewing

Last viewed: 4 hours ago

The PlasmaPro 80 is a compact, space-saving system that provides versatile etch and deposition solutions in an easy-to-use, ope...

Oxford Instruments Ltd.

High-speed remote plasma ALD equipment Atomfab ALD atomic deposition system

540+ people viewing

Last viewed: 4 hours ago

Atomfab enables plasma ALD processes for high-speed, low-damage, low-cost-of-ownership manufacturing for GaN power/RF devices. ...

Oxford Instruments Ltd.

Cryogenic Raman imaging cryoRaman

520+ people viewing

Last viewed: 19 hours ago

CryoRaman enables Raman imaging measurements at extremely low temperatures with unparalleled spatial resolution. It was develop...

Oxford Instruments Ltd.

A flexible solution for plasma-enhanced chemical vapor deposition processes PlasmaPro 800 PECVD

510+ people viewing

The PlasmaPro 800 provides a flexible solution for plasma-enhanced chemical vapor deposition (PECVD) processes for large wafer ...

Oxford Instruments Ltd.

Nanoscale electrical characterization Conductive AFM (ORCA)

510+ people viewing

Last viewed: 3 hours ago

■Summary - ORCA™ conductive AFM probe holder allows conductive AFM imaging and I-V measurements on all MFP-3D AFM/SPMs. -Standa...

Oxford Instruments Ltd.

High flux output Pinnacles 50kV Microfocus X-ray source

510+ people viewing

Last viewed: 7 hours ago

■Summary Pinnacles 50kV Microfocus X-ray sources are developed for applications requiring high resolution with a wide field of ...

Oxford Instruments Ltd.

Detector Xplore for routine analysis in SEM

500+ people viewing

Last viewed: 4 hours ago

Xplore is a next generation EDS detector ideal for routine analysis in SEM. The detector has a sensor area of ​​30mm2 and 15mm2...

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Website Oxford Instruments Ltd. Website

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5 Oxford Instruments Ltd.'s products are listed.


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