Japan Laser Co., Ltd.'s Scanning Probe Microscopes
9 registered Scanning Probe Microscopes of Japan Laser Co., Ltd.
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) 8 inch (200mm) wafer compatible AFM-IR device Vista 200 PiFM / PiF-IR
This model is compatible with large samples, allowing you to perform AFM-IR measurements by placing an 8-inch (200mm) wafer directly on the sample ...
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device Vista 75 IR, IR-PiFM / PiF-IR
Next-generation PiFM/PiF-IR equipment using photo-induced force.AFM-IR equipment that can be used in a variety of applications for semiconductors, ...
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +s-SNOM, IR-PiFM / PiF-IR
Next-generation PiFM/PiF-IR equipment using photo-induced force.AFM-IR equipment that can be used in a variety of applications for semiconductors, ...
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +PL/Raman, IR-PiFM / PiF-IR
Next-generation PiFM/PiF-IR equipment using photo-induced force.AFM-IR equipment that can be used in a variety of applications for semiconductors, ...
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device Vista One IR, IR-PiFM / PiF-IR
■AFM Vista One features for PiFM This is the most advanced AFM-IR device that overcomes the shortcomings of conventional AFM-IR by adopting the PiF...
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device Vista One IR +s-SNOM, IR-PiFM / PiF-IR
■AFM Vista One features for PiFM This is the most advanced AFM-IR device that overcomes the shortcomings of conventional AFM-IR by adopting the PiF...
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device Vista One IR +PL/Raman, IR-PiFM / PiF-IR
■AFM Vista One features for PiFM This is the most advanced AFM-IR device that overcomes the shortcomings of conventional AFM-IR by adopting the PiF...
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device Vista One DIY, IR-PiFM / PiF-IR
■AFM Vista One features for PiFM This is the most advanced AFM-IR device that overcomes the shortcomings of conventional AFM-IR by adopting the PiF...
![Scanning probe microscope (SPM) AFM-IR device AFM-IR PiFM Nanoscale infrared spectroscopic imaging device [light-induced force microscope]-Japan Laser Co., Ltd.](https://metoree.s3.ap-northeast-1.amazonaws.com/img/products-new/30024292024050560.png)
Japan Laser Co., Ltd.
Scanning probe microscope (SPM) AFM-IR device AFM-IR PiFM Nanoscale infrared spectroscopic imaging device [light-induced force microscope]
■Features of AFM-IR PiFM nanoscale infrared spectroscopic imaging device [photoinduced force microscope] ・World's highest spatial resolution 10nm ...
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