Next -generation detector technology XRD detection unit that realizes high quality diffraction data pixos
Anton Paar GmbH
About This Product
■ Next -generation detection device technology that realizes high quality diffraction data
・ The Solid State Hybrid Pixel detector contained in the Pixos ™ detection unit is based on the CERN TimePix3 chip.
・ By detecting individual photons by high space and time resolution, the excellent angle resolution of the conversion signal is obtained during work in 1D mode.
・ Single photographer quantity detector provides the highest quality data even in low signals. In addition, the maximum number of plans is high, so it is possible to measure with a direct beam without using the attenuation or beam stop.
■ Complete vacuum: Measurement in the lower background as possible
-The Pixos ™ detection unit, which has been completely vacuumed, prevents air scattering during measurement and achieves the optimal S/N ratio in each measurement. This is especially important when measuring the background such as PDF analysis and SAXS, or measuring small samples with weak scattered signals.
-The vacuum secondary beam path contributes to the high data quality measured by the Pixos ™ detection unit of XRDYNAMIC 500 by combining with other components in the Trubeam ™ concept.
■ Outstanding resolution due to the smallest pixel size in the market
The detector of the Pixos ™ detection unit is 55 µm x 55 µm, which is the largest XRD platform, so it achieves overwhelming measurement and resolution. By combining this small pixel size and a large goniometer used in the XRDynamic 500 TrubEam ™ concept, the measurement with a standard Bragg-BRENTANO configuration is 20%better than the conventional diffraction device. Is realized.
■ Minimization of noise by automatic optimization
The Pixos ™ detection unit is equipped with a high -precision electric scattering slit that can be set from the control software for each scan. Since the mode can be selected, it is also possible to read the defined slit opening settings, or simplify the work using an automatic optimization mode that maximizes scattered noise without cutting the measurement signal. 。
■ Compatible device
Fully automatic multipurpose X -ray diffraction device: XRDynamic 500
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Product
Next -generation detector technology XRD detection unit that realizes high quality diffraction data pixos
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Handling Company
Anton Paar GmbH
3 Models of Next -generation detector technology XRD detection unit that realizes high quality diffraction data pixos
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
| Product Image | Part Number | Price (excluding tax) | Corresponding wavelength | Deficient channel | Detection mode | Maximum number of plans | Number of pixels | Pixel size | Sensor material |
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Pixos 1000 |
Available upon quote | Full wavelength | - | 0D | 6.8 x 1010CPS (overall) | - | - | Si |
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Pixos 2000 |
Available upon quote | All wavelengths (optimization according to CU, Co, CR) | 0 | 0D, 1D | 2.65 x 109cps (line), 6.8 x 1010CPS (overall) | 256 x 256 | 55μm x 55μm | Si |
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Pixos 2000 CDTE |
Available upon quote | All wavelength (optimization according to MO, AG) | 0 | 0D, 1D | 2.65 x 109cps (line), 6.8 x 1010CPS (overall) | 256 x 256 | 55μm x 55μm | CDTE |
Click on the part number for more information about each product
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